Diagnostic Tests and Diagnosis for Delay Faults Using Path Segmentation
Flenker, Tino, Sulflow, Andre, Fey, Goerschwin
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
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Conference Proceeding
Journal Article
Decision Tree Models of Continuous Systems
Plambeck, Swantje, Fey, Gorschwin
Published in 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) (06.09.2022)
Published in 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) (06.09.2022)
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Conference Proceeding
Exact diagnosis using Boolean Satisfiability
Riener, Heinz, Fey, Goerschwin
Published in 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2016)
Published in 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2016)
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Conference Proceeding
Decision Trees for Analyzing Influences on the Accuracy of Indoor Localization Systems
Schyga, Jakob, Plambeck, Swantje, Hinckeldeyn, Johannes, Fey, Gorschwin, Kreutzfeldt, Jochen
Published in 2022 IEEE 12th International Conference on Indoor Positioning and Indoor Navigation (IPIN) (05.09.2022)
Published in 2022 IEEE 12th International Conference on Indoor Positioning and Indoor Navigation (IPIN) (05.09.2022)
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Conference Proceeding
DEL: Dynamic Symbolic Execution-based Lifter for Enhanced Low-Level Intermediate Representation
Abdelmaksoud, Hany, Hammadeh, Zain A. H., Fey, Goerschwin, Ludtke, Daniel
Published in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.04.2023)
Published in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.04.2023)
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Conference Proceeding
Debugging hardware designs using dynamic dependency graphs
Malburg, Jan, Finder, Alexander, Fey, Görschwin
Published in Microprocessors and microsystems (01.11.2016)
Published in Microprocessors and microsystems (01.11.2016)
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Journal Article
Towards the Automatic Generation of Models for Prediction, Monitoring, and Testing of Cyber-Physical Systems
Knitt, Markus, Plambeck, Swantje, Wieck, Jan Christian, Kohlisch, Julian, Balduin, Stephan, Veith, Eric MSP, Schyga, Jakob, Hinckeldeyn, Johannes, Fey, Goerschwin, Kreutzfeldt, Jochen
Published in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) (12.09.2023)
Published in 2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) (12.09.2023)
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Conference Proceeding
Latency Analysis for Sequential Circuits
Finder, Alexander, Sulflow, Andre, Fey, Gorschwin
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2014)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2014)
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Journal Article
Fault Analysis of the Beam Acceleration Control System at the European XFEL using Data Mining
Grunhagen, Arne, Branlard, Julien, Eichler, Annika, Martino, Gianluca, Fey, Gorschwin, Tropmann-Frick, Marina
Published in 2021 IEEE 30th Asian Test Symposium (ATS) (01.11.2021)
Published in 2021 IEEE 30th Asian Test Symposium (ATS) (01.11.2021)
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Conference Proceeding
Mining Latency Guarantees for RTL Designs
Malburg, Jan, Riener, Heinz, Fey, Gorschwin
Published in 2018 IEEE 48th International Symposium on Multiple-Valued Logic (ISMVL) (01.05.2018)
Published in 2018 IEEE 48th International Symposium on Multiple-Valued Logic (ISMVL) (01.05.2018)
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Conference Proceeding
Time-triggered data transfers over SpaceWire for distributed systems
Borchers, Kai, Ludtke, Daniel, Fey, Gorschwin, Montenegro, Sergio
Published in 2018 IEEE Aerospace Conference (01.03.2018)
Published in 2018 IEEE Aerospace Conference (01.03.2018)
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Conference Proceeding
Debug Automation for Synchronization Bugs at RTL
Dehbashi, Mehdi, Fey, Görschwin
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)
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Conference Proceeding
Journal Article