by Mauroux, P.-D., Virazel, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Godard, B., Festes, G., Vachez, L.
Published in Journal of electronic testing (01.04.2012)

by JACOB, S, DE SALVO, B, DUFOURCQ, J, JALAGUIER, E, PEDRON, T, BOULANGER, F, DELEONIBUS, S, PERNIOLA, L, FESTES, G, BODNAR, S, COPPARD, R, THIERY, J. F, PATE-CAZAL, T, BONGIORNO, C, LOMBARDO, S
Published in Solid-state electronics (01.09.2008)

by Jourba, S., Bollon, N., Decobert, C., Festes, G., Bertello, B., Zhou, F., Markov, V., Tkachev, Y., Kim, J., Ghazav, P., Liu, X., Do, N., Richter, R., Dunkel, S., Trentzsch, M., Zaka, A., Herrmann, T., Melde, T., Muller, B., Mauersberger, F., Bayha, B., Wittek, S., Duggan, M., Beyer, S.
Published in 2020 IEEE International Memory Workshop (IMW) (01.05.2020)

by Dentan, M., Abbon, P., Borgeaud, P., Delagnes, E., Fourches, N., Lachartre, D., Lugiez, F., Paul, B., Rouger, M., Truche, R., Blanc, J.P., Faynot, O., Leroux, C., Delevoye-Orsier, E., Pelloie, J.L., de Pontcharra, J., Flament, O., Guebhard, J.M., Leray, J.L., Montaron, J., Musseau, O., Vitez, A., Le Mouellic, C., Corbiere, T., Dantec, A., Festes, G., Martinez, J., Rodde, K.
Published in IEEE transactions on nuclear science (01.08.1999)

by Chantre, A., Festes, G., Giroult-Matlakowski, G., Nouailhat, A.
Published in IEEE transactions on electron devices (01.06.1991)

by Mauroux, P.-D, Virazel, A, Bosio, A, Dilillo, L, Girard, P, Pravossoudovitch, S, Godard, B, Festes, G, Vachez, L
Published in 2010 15th IEEE European Test Symposium (01.05.2010)

by Mauroux, P.-D, Virazel, A, Bosio, A, Dilillo, L, Girard, P, Pravossoudovitch, S, Godard, B, Festes, G, Vachez, L
Published in 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (01.04.2011)

by Chantre, A., Festes, G., Giroult-Matlakowski, G., Nouailhat, A.
Published in IEEE transactions on electron devices (01.01.1991)

by Mauroux, P-d, Virazel, A, Bosio, A, Dilillo, L, Girard, P, Pravossoudovitch, S, Godard, B, Festes, G, Vachez, L
Published in Journal of electronic testing (01.04.2012)

by Jacob, S., De Salvo, B., Perniola, L., Festes, G., Bodnar, S., Coppard, R., Thiery, J.F., Pate-Cazal, T., Bongiorno, C., Lombardo, S., Dufourcq, J., Jalaguier, E., Pedron, T., Boulanger, F., Deleonibus, S.
Published in Solid-state electronics (01.11.2008)

by Jacob, S., De Salvo, B., Perniola, L., Festes, G., Bodnar, S., Coppard, R., Thiery, J.F., Pate-Cazal, T., Bongiorno, C., Lombardo, S., Dufourcq, J., Jalaguier, E., Pedron, T., Boulanger, F., Deleonibus, S.
Published in Solid-state electronics (01.09.2008)

by Jacob, S., Festes, G., Bodnar, S., Coppard, R., Thiery, J.F., Pate-Cazal, T., Pedron, T., De Salvo, B., Perniola, L., Jalaguier, E., Boulanger, F., Deleonibus, S.
Published in ESSDERC 2007 - 37th European Solid State Device Research Conference (01.09.2007)

by Chantre, A, Festes, G, Giroult-Matlakowski, G, Nouailhat, A
Published in IEEE transactions on electron devices (01.06.1991)

by Mauroux, P.-D, Virazel, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Godard, B., Festes, G., Vachez, L.
Published in 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) (01.04.2011)

by Jacob, S., Perniola, L., Festes, G., Bodnar, S., Coppard, R., Thiery, J.F., Pedron, T., Jalaguier, E., Boulanger, F., De Salvo, B., Deleonibus, S.
Published in 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop (01.08.2007)

by Jacob, S., Perniola, L., Scheiblin, P., De Salvo, B., Lecarval, G., Jalaguier, E., Festes, G., Coppard, R., Boulanger, F., Deleonibus, S.
Published in 2006 7th Annual Non-Volatile Memory Technology Symposium (01.11.2006)

by Dentan, M., Abbon, P., Borgeaud, P., Delagnes, E., Fourches, N., Lachartre, D., Lugiez, F., Paul, B., Rouger, M., Truche, R., Blanc, J.P., Faynot, O., Leroux, C., Delevoye-Orsier, E., Pelloie, J.L., de Pontcharra, J., Flament, O., Guebhard, J.M., Leray, J.L., Montaron, J., Musseau, O., Vitez, A., Le Mouellic, C., Corbiere, T., Dantec, A., Festes, G., Martinez, J., Rodde, K.
Published in 1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255) (1998)