A machine learning approach to model the impact of line edge roughness on gate-all-around nanowire FETs while reducing the carbon footprint
García-Loureiro, Antonio, Seoane, Natalia, Fernández, Julián G, Comesaña, Enrique, Pichel, Juan C
Published in PloS one (24.07.2023)
Published in PloS one (24.07.2023)
Get full text
Journal Article
Optimization of thermionic cooling semiconductor heterostructures with deep learning techniques
Fernandez, Julian G., Etesse, Gueric, Comesana, Enrique, Seoane, Natalia, Zhu, Xiangyu, Hirakawa, Kazuhiko, Garcia-Loureiro, Antonio, Bescond, Marc
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Get full text
Conference Proceeding
A general toolkit for advanced semiconductor transistors: from simulation to machine learning
Garcia-Loureiro, Antonio J., Seoane, Natalia, Fernandez, Julian G., Comesana, Enrique
Published in 2023 IEEE Latin American Electron Devices Conference (LAEDC) (03.07.2023)
Published in 2023 IEEE Latin American Electron Devices Conference (LAEDC) (03.07.2023)
Get full text
Conference Proceeding
A comprehensive Pelgrom-based on-current variability model for FinFET, NWFET and NSFET
Fernandez, Julian G., Seoane, Natalia, Comesaña, Enrique, Garcia-Loureiro, Antonio
Published in Solid-state electronics (01.01.2023)
Published in Solid-state electronics (01.01.2023)
Get full text
Journal Article