Investigation of TID and Dynamic Burn-In-Induced V} Shift on RTG4 Flash-Based FPGA
Rezzak, Nadia, Wang, Jih-Jong, Traas, Michael, Zerrouki, Amal, Bakker, Gregory, Xue, Fengliang, Cai, Alex, Hawley, Frank, McCollum, John, Hamdy, Esmat
Published in IEEE transactions on nuclear science (01.01.2018)
Published in IEEE transactions on nuclear science (01.01.2018)
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Journal Article
Combine Flash-Based FPGA TID and Long-Term Retention Reliabilities Through } Shift
Jih-Jong Wang, Rezzak, Nadia, Dsilva, Durwyn, Fengliang Xue, Samiee, Salim, Singaraju, Pavan, Jia, James, Nguyen, Victor, Hawley, Frank, Hamdy, Esmat
Published in IEEE transactions on nuclear science (01.08.2016)
Published in IEEE transactions on nuclear science (01.08.2016)
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Journal Article
Modified PEDOT-PSS conducting polymer as S/D electrodes for device performance enhancement of P3HT TFTs
Fengliang Xue, Yi Su, Varahramyan, K.
Published in IEEE transactions on electron devices (01.09.2005)
Published in IEEE transactions on electron devices (01.09.2005)
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Journal Article
Electrically bistable memory device based on spin-coated molecular complex thin film
Zhengchun Liu, Fengliang Xue, Yi Su, Varahramyan, K.
Published in IEEE electron device letters (01.03.2006)
Published in IEEE electron device letters (01.03.2006)
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Journal Article
High voltage PMOS FET NBTI results and mechanism
Jia, James Yingbo, Liu, Patty, Fengliang Xue, Tien, Jon, Cai, Alex, Dhaoui, Fethi, Singaraju, Pavan, Hawley, Frank, McCollum, John
Published in 2013 IEEE International Integrated Reliability Workshop Final Report (01.10.2013)
Published in 2013 IEEE International Integrated Reliability Workshop Final Report (01.10.2013)
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Conference Proceeding
Inkjet printed silver source/drain electrodes for low-cost polymer thin film transistors
Xue, Fengliang, Liu, Zhengchun, Su, Yi, Varahramyan, Kody
Published in Microelectronic engineering (01.02.2006)
Published in Microelectronic engineering (01.02.2006)
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Journal Article
Flash-Based FPGA TID and Long-Term Retention Reliability through VT Shift Investigation
Jih-Jong Wang, Rezzak, Nadia, Dsilva, Durwyn, Fengliang Xue, Samiee, Salim, Singaraju, Pavan, Jia, James, Hawley, Frank, Hamdy, Esmat
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
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Conference Proceeding
NBTI life time of a high voltage PMOS FET
Jia, James Yingbo, Fengliang Xue, Liu, Patty, Tien, Jon, Cai, Alex, Dhaoui, Fethi, Singaraju, Pavan, Hawley, Frank, McCollum, John
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
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Conference Proceeding
Voltage dependence and AC life time of PMOS HCI
Jia, James Yingbo, Liu, Patty, Fengliang Xue, Tien, Jon, Cai, Alex, Dhaoui, Fethi, Singaraju, Pavan, Hawley, Frank, McCollum, John
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
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Conference Proceeding