Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric Material
Schroeder, Uwe, Richter, Claudia, Park, Min Hyuk, Schenk, Tony, Pešić, Milan, Hoffmann, Michael, Fengler, Franz P. G, Pohl, Darius, Rellinghaus, Bernd, Zhou, Chuanzhen, Chung, Ching-Chang, Jones, Jacob L, Mikolajick, Thomas
Published in Inorganic chemistry (05.03.2018)
Published in Inorganic chemistry (05.03.2018)
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Journal Article
Unveiling the double-well energy landscape in a ferroelectric layer
Hoffmann, Michael, Fengler, Franz P G, Herzig, Melanie, Mittmann, Terence, Max, Benjamin, Schroeder, Uwe, Negrea, Raluca, Lucian, Pintilie, Slesazeck, Stefan, Mikolajick, Thomas
Published in Nature (London) (01.01.2019)
Published in Nature (London) (01.01.2019)
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Journal Article
Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experiment
Park, Min Hyuk, Lee, Young Hwan, Kim, Han Joon, Schenk, Tony, Lee, Woongkyu, Kim, Keum Do, Fengler, Franz P G, Mikolajick, Thomas, Schroeder, Uwe, Hwang, Cheol Seong
Published in Nanoscale (28.07.2017)
Published in Nanoscale (28.07.2017)
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Journal Article
Domain Pinning: Comparison of Hafnia and PZT Based Ferroelectrics
Fengler, Franz P. G., Pešić, Milan, Starschich, Sergej, Schneller, Theodor, Künneth, Christopher, Böttger, Ulrich, Mulaosmanovic, Halid, Schenk, Tony, Park, Min Hyuk, Nigon, Robin, Muralt, Paul, Mikolajick, Thomas, Schroeder, Uwe
Published in Advanced electronic materials (01.04.2017)
Published in Advanced electronic materials (01.04.2017)
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Journal Article
Analysis of Performance Instabilities of Hafnia‐Based Ferroelectrics Using Modulus Spectroscopy and Thermally Stimulated Depolarization Currents
Fengler, Franz P. G., Nigon, Robin, Muralt, Paul, Grimley, Everett D., Sang, Xiahan, Sessi, Violetta, Hentschel, Rico, LeBeau, James M., Mikolajick, Thomas, Schroeder, Uwe
Published in Advanced electronic materials (01.03.2018)
Published in Advanced electronic materials (01.03.2018)
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Journal Article
A Silicon Nanowire Ferroelectric Field‐Effect Transistor
Sessi, Violetta, Simon, Maik, Mulaosmanovic, Halid, Pohl, Darius, Loeffler, Markus, Mauersberger, Tom, Fengler, Franz P. G., Mittmann, Terence, Richter, Claudia, Slesazeck, Stefan, Mikolajick, Thomas, Weber, Walter M.
Published in Advanced electronic materials (01.04.2020)
Published in Advanced electronic materials (01.04.2020)
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Journal Article
Comparison of hafnia and PZT based ferroelectrics for future non-volatile FRAM applications
Fengler, Franz P. G., Pesic, Milan, Starschich, Sergej, Schneller, Theodor, Bottger, Ulrich, Schenk, Tony, Min Hyuk Park, Mikolajick, Thomas, Schroeder, Uwe
Published in 2016 46th European Solid-State Device Research Conference (ESSDERC) (01.09.2016)
Published in 2016 46th European Solid-State Device Research Conference (ESSDERC) (01.09.2016)
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Conference Proceeding
Root cause of degradation in novel HfO2-based ferroelectric memories
Pesic, Milan, Fengler, Franz P. G., Slesazeck, Stefan, Schroeder, Uwe, Mikolajick, Thomas, Larcher, Luca, Padovani, Andrea
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experimentElectronic supplementary information (ESI) available. See DOI: 10.1039/c7nr02121f
Park, Min Hyuk, Lee, Young Hwan, Kim, Han Joon, Schenk, Tony, Lee, Woongkyu, Kim, Keum Do, Fengler, Franz P. G, Mikolajick, Thomas, Schroeder, Uwe, Hwang, Cheol Seong
Year of Publication 20.07.2017
Year of Publication 20.07.2017
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Journal Article
2D Mapping of Chemical and Field Effect Passivation of Al2O3 on Silicon Substrates
Jordan, Paul M., Simon, Daniel K., Fengler, Franz P.G., Mikolajick, Thomas, Dirnstorfer, Ingo
Published in Energy procedia (01.08.2015)
Published in Energy procedia (01.08.2015)
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Journal Article