by Joseph, A.J., Dunn, J., Nowak, E., Harame, D.L., Jagannathan, B., Coolbaugh, D., Ahlgren, D., Magerlein, J., Lanzerotti, L., Feilchenfeld, N., St Onge, S.
Published in Proceedings of the IEEE (2005)

by Minixhofer, R, Feilchenfeld, N, Knaipp, M, Röhrer, G, Park, J M, Zierak, M, Enichlmair, H, Levy, M, Loeffler, B, Hershberger, D, Unterleitner, F, Gautsch, M, Chatty, K, Shi, Y, Posch, W, Seebacher, E, Schrems, M, Dunn, J, Harame, D
Published in 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.06.2010)

by Voldman, S., Gebreselasie, E., Zierak, M., Hershberger, D., Collins, D., Feilchenfeld, N., St Onge, S., Dunn, J.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Voldman, S., Gebreselasie, E., Lanzerotti, L., Larsen, T., Feilchenfeld, N., St Onge, S., Joseph, A., Dunn, J.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Feilchenfeld, N. B., Anderson, F. G., Barwicz, T., Chilstedt, S., Ding, Y., Ellis-Monaghan, J., Gill, D. M., Hedges, C., Hofrichter, J., Horst, F., Khater, M., Kiewra, E., Leidy, R., Martin, Y., McLean, K., Nicewicz, M., Orcutt, J. S., Porth, B., Proesel, J., Reinholm, C., Rosenberg, J. C., Sacher, W. D., Stricker, A. D., Whiting, C., Xiong, C., Agrawal, A., Baker, F., Baks, C. W., Cucci, B., Dang, D., Doan, T., Doany, F., Engelmann, S., Gordon, M., Joseph, E., Maling, J., Shank, S., Tian, X., Willets, C., Ferrario, J., Meghelli, M., Libsch, F., Offrein, B., Green, W. M. J., Haensch, W.
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)

by Jong Mun Park, Knaipp, M., Enichlmair, H., Minixhofer, R., Yun Shi, Feilchenfeld, N.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)

by Dunn, James S, Ahlgren, David C, Coolbaugh, Douglas D, Feilchenfeld, Natalie B
Published in IBM journal of research and development (01.03.2003)

by Sharma, S., Letavic, T., Yun Shi, Loiseau, A., Monaghan, J.-E, Feilchenfeld, N., Phelps, R., Lamothe, C., Cook, D., Dunn, J., Roerher, G., Nauschnig, H., Minixhofer, R.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)

by Yun Shi, Feilchenfeld, N., Phelps, R., Levy, M., Knaipp, M., Minixhofer, R.
Published in 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs (01.05.2011)

by Ellis-Monaghan, J., Yun Shi, Sharma, S., Feilchenfeld, N., Letavic, T., Phelps, R., Hedges, C., Cook, D., Dunn, J.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)

by FEILCHENFELD, N. B, WADDELL, W. H
Published in Chemical physics letters (1984)

by Waddell, Walter H, Feilchenfeld, Natalie B
Published in Journal of the American Chemical Society (01.08.1983)

by He, Z.X., Daley, D., Bolam, R., Vanslette, D., Chen, F., Cooney, E., Mosher, D., Feilchenfeld, N., Newton, K., Eshun, E., Rassel, R., Benoit, J., Coolbaugh, D., St. Onge, S., Dunn, J.
Published in 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2008)

by Orcutt, J. S., Gill, D. M., Proesel, J., Ellis-Monaghan, J., Horst, F., Barwicz, T., Xiong, C., Anderson, F. G., Agrawal, A., Martin, Y., Baks, C. W., Khater, M., Rosenberg, J. C., Sacher, W. D., Hofrichter, J., Kiewra, E., Stricker, A. D., Libsch, F., Offrein, B., Meghelli, M., Feilchenfeld, N. B., Haensch, W., Green, W. M. J.
Published in 2016 Optical Fiber Communications Conference and Exhibition (OFC) (01.03.2016)

by Feilchenfeld, Natalie B., Richter, Helen W., Waddell, Walter H.
Published in Analytical biochemistry (01.05.1982)

by Candra, P., Dahlstrom, M., Zierak, M., Voegeli, B., Watson, K., Gray, P., He, Z.X., Rassel, R.M., Von Bruns, S., Schmidt, N., Camillo-Castillo, R., Previty-Kelly, R., Gautsch, M., Norris, A., Gordon, M., Chapman, P., Hershberger, D., Lukaitis, J., Feilchenfeld, N., Joseph, A., St. Onge, S.A., Dunn, J.
Published in 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2008)

by Rosenberg, J. C., Horst, F., Khater, M., Anderson, F. G., Leidy, R., Barwicz, T., Gill, D., Kiewra, E., Martin, Y., Orcutt, J. S., Stricker, A. D., Whiting, C., McLean, K., Porth, B., Xiong, C., Feilchenfeld, N., Giewont, K., Nummy, K., Offrein, B. J., Haensch, W., Green, W. M. J.
Published in 2017 European Conference on Optical Communication (ECOC) (01.09.2017)

by Dunn, J S, Ahlgren, D C, Coolbaugh, D D, Feilchenfeld, N B, Freeman, G, Greenberg, D R, Groves, R A, Guarin, F J, Hammad, Y, Joseph, A J, Lanzerotti, L D, St Onge, S A, Orner, B A, Rieh, J-S, Stein, K J, Voldman, S H, Wang, P-C, Zierak, M J, Subbanna, S
Published in IBM journal of research and development (01.03.2003)

by Dunn, J., Harame, D.L., Joseph, A.J., St Onge, S.A., Feilchenfeld, N.B., Lanzerotti, L., Orner, B., Gebreselasie, E., Johnson, J.B., Coolbaugh, D.D., Rassel, R., Khater, M.
Published in IEEE Custom Integrated Circuits Conference 2006 (01.09.2006)

by Kim, Sook Hui, Chen, Hui Lan, Feilchenfeld, Natalie, Halpern, Jack
Published in Journal of the American Chemical Society (01.05.1988)