Study of hot-carrier-induced photon emission from 90 nm Si MOSFETs
Gurfinkel, M., Borenshtein, M., Margulis, A., Sade, S., Fefer, Y., Weizman, Y., Shapira, Yoram
Published in Applied surface science (30.07.2005)
Published in Applied surface science (30.07.2005)
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Journal Article
Conference Proceeding
Study of leakage-induced photon emission processes in sub-90 nm CMOS devices
Weizman, Y., Gurfinkel, M., Margulis, A., Fefer, Y., Shapira, Y., Baruch, E.
Published in Solid-state electronics (01.06.2006)
Published in Solid-state electronics (01.06.2006)
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Journal Article
Conference Proceeding
Study of hot-carrier-induced photon emission from 90nm Si MOSFETs
Gurfinkel, M., Borenshtein, M., Margulis, A., Sade, S., Fefer, Y., Weizman, Y., Shapira, Yoram
Published in Applied surface science (01.07.2005)
Published in Applied surface science (01.07.2005)
Get full text
Journal Article
Study of leakage-induced photon emission processes in sub-90nm CMOS devices
Weizman, Y., Gurfinkel, M., Margulis, A., Fefer, Y., Shapira, Y., Baruch, E.
Published in Solid-state electronics (01.06.2006)
Published in Solid-state electronics (01.06.2006)
Get full text
Journal Article
Supply signal fluctuations due to chip power grid resonance - a new reliability concern
Gurfinkel, M., Livshits, P., Rozen, A., Fefer, Y., Bernstein, J.B., Shapira, Y.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
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Conference Proceeding
Local Oscillations of On-Die Supply Voltage-A Reliability Issue
Gurfinkel, M., Livshits, P., Rozen, A., Fefer, Y., Bernstein, J.B., Shapira, Y.
Published in IEEE transactions on device and materials reliability (01.09.2009)
Published in IEEE transactions on device and materials reliability (01.09.2009)
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Magazine Article
Active system for compensation for IR drops
Sofer, S., Fefer, Y., Tzytkin, D.
Published in 2008 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (01.05.2008)
Published in 2008 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (01.05.2008)
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Conference Proceeding
Inter-symbol interference (ISI) in on-die transmission lines
Rysin, A., Livshits, P., Sofer, S., Mantel, O., Shapira, Y., Fefer, Y.
Published in 2009 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems (01.11.2009)
Published in 2009 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems (01.11.2009)
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Conference Proceeding
Study of Leakage-Induced Photon Emission processes in sub-90 nm CMOS Devices
Weizman, Y., Gurfinkel, M., Margulis, A., Fefer, Y., Shapira, Y., Baruch, E.
Published in 2005 International Semiconductor Device Research Symposium (2005)
Published in 2005 International Semiconductor Device Research Symposium (2005)
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Conference Proceeding
Increased Resistive Losses of Copper Interconnects in ULSI Devices-A Reliability Issue
Livshits, P., Rysin, A., Sofer, S., Fefer, Y.
Published in IEEE transactions on device and materials reliability (01.09.2011)
Published in IEEE transactions on device and materials reliability (01.09.2011)
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Magazine Article