Cell-Aware Test
Hapke, Friedrich, Redemund, Wilfried, Glowatz, Andreas, Rajski, Janusz, Reese, Michael, Hustava, Marek, Keim, Martin, Schloeffel, Juergen, Fast, Anja
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2014)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2014)
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Journal Article
Defect-Oriented Test: Effectiveness in High Volume Manufacturing
Hapke, Friedrich, Howell, Will, Maxwell, Peter, Brazil, Edward, Venkataraman, Srikanth, Dutta, Rudrajit, Glowatz, Andreas, Fast, Anja, Rajski, Janusz
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2021)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.2021)
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Journal Article