A study of self- and mutual-heating in wafer level packaging systems
Hau-Riege, Christine, Guoping Xu, Zhang, Q. J., YouWen Yau, Farr, Hosain
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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