Field-effect transistors with thin ZnO as active layer for gas sensor applications
Farmakis, F.V., Speliotis, Th, Alexandrou, K.P., Tsamis, C., Kompitsas, M., Fasaki, I., Jedrasik, P., Petersson, G., Nilsson, B.
Published in Microelectronic Engineering (01.05.2008)
Published in Microelectronic Engineering (01.05.2008)
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Journal Article
Conference Proceeding
Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors
Angelis, C. T., Dimitriadis, C. A., Miyasaka, M., Farmakis, F. V., Kamarinos, G., Brini, J., Stoemenos, J.
Published in Journal of applied physics (15.10.1999)
Published in Journal of applied physics (15.10.1999)
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Journal Article
Characterization of thin film transistors fabricated on different sequential lateral solidified poly-silicon substrates
Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Farmakis, F.V., Voutsas, A.T.
Published in Microelectronic engineering (01.05.2008)
Published in Microelectronic engineering (01.05.2008)
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Journal Article
Conference Proceeding
Origin of low-frequency noise in polycrystalline silicon thin-film transistors
Dimitriadis, C. A., Farmakis, F. V., Kamarinos, G., Brini, J.
Published in Journal of applied physics (15.06.2002)
Published in Journal of applied physics (15.06.2002)
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Journal Article
Hydrogenation in laser annealed polysilicon thin-film transistors (TFTs)
Farmakis, F.V., Tsamados, D.M., Brini, J., Kamarinos, G., Dimitriadis, C.A., Miyasaka, M.
Published in Thin solid films (15.02.2001)
Published in Thin solid films (15.02.2001)
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Journal Article
Conference Proceeding
Low frequency noise in Schottky barrier contacts of titanium nitride on n-type silicon
Farmakis, F V, Brini, J, Mathieu, N, Kamarinos, G, Dimitriadis, C A, Logothetidis, S
Published in Semiconductor science and technology (01.11.1998)
Published in Semiconductor science and technology (01.11.1998)
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Journal Article
Effects of hydrogenation on the performance and hot-carrier endurance of polysilicon thin-film transistors
Farmakis, F.V., Dimitriadis, C.A., Brini, J., Kamarinos, G.
Published in IEEE electron device letters (01.02.2001)
Published in IEEE electron device letters (01.02.2001)
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Journal Article
Degradation and lifetime estimation of n-MOS SLS ELA polycrystalline TFTs during hot carrier stressing: effect of channel width in the region Vth ≤ VGS,stress ≤ VDS,stress/2
Kontogiannopoulos, G P, Farmakis, F V, Kouvatsos, D N, Papaioannou, G J, Voutsas, A T
Published in Semiconductor science and technology (01.07.2009)
Published in Semiconductor science and technology (01.07.2009)
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Journal Article
Device degradation behavior and polysilicon film morphology of thin film transistors fabricated using advanced excimer laser lateral solidification techniques
Kouvatsos, D.N., Voutsas, A.T., Michalas, L., Farmakis, F.V., Papaioannou, G.J.
Published in Thin solid films (16.07.2007)
Published in Thin solid films (16.07.2007)
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Journal Article
Conference Proceeding
Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress
Farmakis, F.V., Kontogiannopoulos, G.P., Kouvatsos, D.N., Voutsas, A.T.
Published in Microelectronics and reliability (01.09.2007)
Published in Microelectronics and reliability (01.09.2007)
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Journal Article
Conference Proceeding
On-current modeling of large-grain polycrystalline silicon thin-film transistors
Farmakis, F.V., Brini, J., Kamarinos, G., Angelis, C.T., Dimitriadis, C.A., Miyasaka, M.
Published in IEEE transactions on electron devices (01.04.2001)
Published in IEEE transactions on electron devices (01.04.2001)
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Journal Article
Leakage current variation during two different modes of electrical stressing in undoped hydrogenated n-channel polysilicon thin film transistors (TFTs)
Farmakis, F.V., Brini, J., Kamarinos, G., Dimitriadis, C.A., Gueorguiev, V.K., Ivanov, Tz.E.
Published in Microelectronics and reliability (1999)
Published in Microelectronics and reliability (1999)
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Journal Article
Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors
Dimitriadis, C.A, Kimura, M, Miyasaka, M, Inoue, S, Farmakis, F.V, Brini, J, Kamarinos, G
Published in Solid-state electronics (01.11.2000)
Published in Solid-state electronics (01.11.2000)
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Journal Article
Dependence of the leakage current on the film quality in polycrystalline silicon thin-film transistors
Dimitriadis, C. A., Farmakis, F. V., Brini, J., Kamarinos, G.
Published in Journal of applied physics (01.09.2000)
Published in Journal of applied physics (01.09.2000)
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Journal Article