by Cheng-Liang Huang, Faricelli, J.V., Antoniadis, D.A., Khalil, N.A., Rios, R.A.
Published in IEEE transactions on electron devices (01.06.1996)

by Huang, C.-L., Faricelli, J.V., Arora, N.D.
Published in IEEE transactions on electron devices (01.06.1993)

by Habas, P., Faricelli, J.V.
Published in IEEE transactions on electron devices (01.06.1992)

by Nulman, J., Faricelli, J.V., Krusius, J.P., Frey, J.
Published in IEEE transactions on electron devices (01.10.1983)

by Faricelli, J.V., Frey, J., Krusius, J.P.
Published in IEEE transactions on electron devices (01.03.1982)

by Krusius, J.P., Nulman, J., Faricelli, J.V., Frey, J.
Published in IEEE transactions on electron devices (01.03.1982)