3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing
Shao, K, Morisset, A, Pouget, V, Faraud, E, Larue, C, Lewis, D, McMorrow, D
Published in Optics express (07.11.2011)
Published in Optics express (07.11.2011)
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Journal Article
Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing
Faraud, E., Pouget, V., Shao, K., Larue, C., Darracq, F., Lewis, D., Samaras, A., Bezerra, F., Lorfevre, E., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Comparison of classical and two-photon photoelectric laser stimulation capabilities for failure analysis
Shao, K., Pouget, V., Faraud, E., Larue, C., Lewis, D.
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)
Published in 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2011)
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Conference Proceeding