Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging
Fang, Yi-Pin, Oates, Anthony S.
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
Soft error rate cross-technology prediction on embedded DRAM
Yi-Pin Fang, Vaidyanathan, B., Oates, A.S.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Impact of Strained-Si PMOS Transistors on SRAM Soft Error Rates
Mahatme, Nihaar N., Bhuva, Bharat L., Fang, Yi-Pin, Oates, Anthony S.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Characterization of Single Bit and Multiple Cell Soft Error Events in Planar and FinFET SRAMs
Yi-Pin Fang, Oates, Anthony S.
Published in IEEE transactions on device and materials reliability (01.06.2016)
Published in IEEE transactions on device and materials reliability (01.06.2016)
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Magazine Article
Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices
Yi-Pin Fang, Oates, A. S.
Published in IEEE transactions on device and materials reliability (01.03.2014)
Published in IEEE transactions on device and materials reliability (01.03.2014)
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Magazine Article
Muon-Induced Soft Errors in SRAM Circuits in the Terrestrial Environment
Yi-Pin Fang, Oates, Anthony S.
Published in IEEE transactions on device and materials reliability (01.03.2015)
Published in IEEE transactions on device and materials reliability (01.03.2015)
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Magazine Article
A simple method to fabricate single electron devices
Yi-Pin Fang, Ya-Chang Chou, Shu-Fen Hu, Gwo-Jen Hwang
Published in 2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) (2004)
Published in 2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846) (2004)
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Conference Proceeding