Electron trapping in amorphous Al2O3
Sambuco Salomone, L., Campabadal, F., Faigón, A.
Published in Journal of applied physics (28.02.2018)
Published in Journal of applied physics (28.02.2018)
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Journal Article
Numerical Modeling of Oxide and Interface Charge Buildup in Field Oxide Transistors During Irradiation and Annealing
Gomes, E. N., Garcia Cozzi, R., Garcia-Inza, M., Carbonetto, S., Cassani, M. V., Redin, E., Faigon, A., Sambuco Salomone, L.
Published in IEEE transactions on nuclear science (01.09.2024)
Published in IEEE transactions on nuclear science (01.09.2024)
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Journal Article
Numerical modeling of radiation-induced charge neutralization in MOS devices
Sambuco Salomone, L., Garcia-Inza, M., Carbonetto, S., Lipovetzky, J., Redin, E., Faigón, A.
Published in Radiation measurements (01.04.2022)
Published in Radiation measurements (01.04.2022)
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Journal Article
Experimental characterization and numerical modeling of total ionizing dose effects on field oxide MOS dosimeters
Cassani, M.V., Sambuco Salomone, L., Carbonetto, S., Faigón, A., Redin, E., Garcia-Inza, M.
Published in Radiation physics and chemistry (Oxford, England : 1993) (01.05.2021)
Published in Radiation physics and chemistry (Oxford, England : 1993) (01.05.2021)
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Journal Article
Long Term Effects of Charge Redistribution in Cycled Bias Operating MOS Dosimeter
Sambuco Salomone, L., Holmes-Siedle, A., Faigón, A.
Published in IEEE transactions on nuclear science (01.12.2016)
Published in IEEE transactions on nuclear science (01.12.2016)
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Journal Article
6MV LINAC characterization of a MOSFET dosimeter fabricated in a CMOS process
Garcia-Inza, M., Cassani, M., Carbonetto, S., Casal, M., Redín, E., Faigón, A.
Published in Radiation measurements (01.10.2018)
Published in Radiation measurements (01.10.2018)
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Journal Article
Electrical Characterization of Defects Created by γ-Radiation in HfO2-Based MIS Structures for RRAM Applications
García, H., González, M. B., Mallol, M. M., Castán, H., Dueñas, S., Campabadal, F., Acero, M. C., Sambuco Salomone, L., Faigón, A.
Published in Journal of electronic materials (01.09.2018)
Published in Journal of electronic materials (01.09.2018)
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Journal Article
Experimental evidence and modeling of two types of electron traps in Al2O3 for nonvolatile memory applications
Sambuco Salomone, L., Lipovetzky, J., Carbonetto, S. H., García Inza, M. A., Redin, E. G., Campabadal, F., Faigón, A.
Published in Journal of applied physics (21.02.2013)
Published in Journal of applied physics (21.02.2013)
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Journal Article
Deep electron traps in HfO2-based metal-oxide-semiconductor capacitors
Salomone, L. Sambuco, Lipovetzky, J., Carbonetto, S.H., García Inza, M.A., Redin, E.G., Campabadal, F., Faigón, A.
Published in Thin solid films (01.02.2016)
Published in Thin solid films (01.02.2016)
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Journal Article
Switched Bias Differential MOSFET Dosimeter
Garcia-Inza, M., Carbonetto, S., Lipovetzky, J., Carra, M. J., Sambuco Salomone, L., Redin, E. G., Faigon, A.
Published in IEEE transactions on nuclear science (01.06.2014)
Published in IEEE transactions on nuclear science (01.06.2014)
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Journal Article
CMOS Differential and Amplified Dosimeter with Field Oxide N-Channel MOSFETs
Carbonetto, S., GarcianInza, M., Lipovetzky, J., Carra, M. J., Redin, E., Sambuco Salomone, L., Faigon, A.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Experimental evidence and modeling of non-monotonic responses in MOS dosimeters
Faigón, A., García Inza, M., Lipovetzky, J., Redin, E., Carbonetto, S., Sambuco Salomone, L., Berbeglia, F.
Published in Radiation physics and chemistry (Oxford, England : 1993) (01.02.2014)
Published in Radiation physics and chemistry (Oxford, England : 1993) (01.02.2014)
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Journal Article
Field Oxide n-channel MOS Dosimeters Fabricated in CMOS Processes
Lipovetzky, J., Garcia-Inza, M. A., Carbonetto, S., Carra, M. J., Redin, E., Sambuco Salomone, L., Faigon, A.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article