Wafer-Scale, Sub-5 nm Junction Formation by Monolayer Doping and Conventional Spike Annealing
Ho, Johnny C, Yerushalmi, Roie, Smith, Gregory, Majhi, Prashant, Bennett, Joseph, Halim, Jeffri, Faifer, Vladimir N, Javey, Ali
Published in Nano letters (01.02.2009)
Published in Nano letters (01.02.2009)
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Journal Article
Junction Photovoltage (JPV) Techniques for Ultra-Shallow Junction Characterization
Faifer, Vladimir N., Current, Michael I., Schroder, D., Clarysse, Trudo, Vandervorst, Wilfried
Published in ECS transactions (28.09.2007)
Published in ECS transactions (28.09.2007)
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Journal Article
Apparatus and method for accurate measurement and mapping of forward and reverse-bias current-voltage characteristics of large area lateral p-n junctions
Real James A, Faifer Vladimir N, Nyffenegger Ralph, Kelly-Morgan Ian Sierra Gabriel, Salunke Biren
Year of Publication 29.08.2017
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Year of Publication 29.08.2017
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