Error estimation and enhanced stiffness sensitivity in contact resonance force microscopy with a multiple arbitrary frequency lock-in amplifier (MAFLIA)
Flater, Erin E, Mugdha, Arya C, Gupta, Saurabh, Hudson, William A, Fahrenkamp, Abbigail A, Killgore, Jason P, Wilson, Jesse W
Published in Measurement science & technology (01.11.2020)
Published in Measurement science & technology (01.11.2020)
Get full text
Journal Article