Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch
Warren, K.M., Sierawski, B.D., Reed, R.A., Weller, R.A., Carmichael, C., Lesea, A., Mendenhall, M.H., Dodd, P.E., Schrimpf, R.D., Massengill, L.W., Tan Hoang, Hsing Wan, De Jong, J.L., Padovani, R., Fabula, J.J.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
The NSEU response of static-latch based FPGAs
Fabula, J, Lesea, A
Published in IEE Seminar on Cosmic Radiation - Single Event Effects and Avionics (2005)
Published in IEE Seminar on Cosmic Radiation - Single Event Effects and Avionics (2005)
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Conference Proceeding
The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs
Lesea, A., Drimer, S., Fabula, J.J., Carmichael, C., Alfke, P.
Published in IEEE transactions on device and materials reliability (01.09.2005)
Published in IEEE transactions on device and materials reliability (01.09.2005)
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Magazine Article
Xilinx Virtex V Field Programmable Gate Array Dose Rate Upset Investigations
Vera, A., Llamocca, D., Fabula, J., Kemp, W., Marquez, R., Shedd, W., Alexander, D.
Published in 2008 IEEE Radiation Effects Data Workshop (01.07.2008)
Published in 2008 IEEE Radiation Effects Data Workshop (01.07.2008)
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Conference Proceeding
Stability of Thin-Film Transistors
Fabula, J. J., Schelhorn, R. L., Topfer, M. L.
Published in Fifth Annual Symposium on the Physics of Failure in Electronics (01.11.1966)
Published in Fifth Annual Symposium on the Physics of Failure in Electronics (01.11.1966)
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Conference Proceeding