Manufacturing Control and Optimization of SiGe(C) HBT Epitaxial Growth
Zhang, Nancy, Tan, Poh Cheng, Rodriquez, Angel, Prando, Greg, Nguyen, Chinh, Sinn, Craig, Fung, Min Su, Safran, Laura, Lehman, Gerold (Jerry), Gausepohl, Steve, Mase, Jerry, Bell, Nancy
Published in ECS transactions (20.10.2006)
Published in ECS transactions (20.10.2006)
Get full text
Journal Article
4812756 Contactless technique for semicondutor wafer testing
Curtis, Huntington, Fung, Min-Su, Verkuil, Roger
Published in Microelectronics and reliability (1989)
Published in Microelectronics and reliability (1989)
Get full text
Journal Article
Manufacturing Control and Optimization of SiGe(C) HBT Epitaxial Growth
Zhang, Nancy, Tan, Poh Cheng, Sinn, Craig, Rodriquez, Angel, Prando, Greg, Nguyen, Chinh, Fung, Min Su, Safran, Laura, Lehman, Gerold (Jerry), Gausepohl, Steve, Mase, Jerry, Bell, Nancy
Published in Meeting abstracts (Electrochemical Society) (30.06.2006)
Published in Meeting abstracts (Electrochemical Society) (30.06.2006)
Get full text
Journal Article
Non-contact mobile charge measurement with leakage band-bending and dipole correction
Fung, Min-Su, Verkuil, Roger L, Horner, Gregory S, Howland, William H
Year of Publication 12.06.2007
Get full text
Year of Publication 12.06.2007
Patent
Non-contact mobile charge measurement with leakage band-bending and dipole correction
Fung, Min-Su, Verkuil, Roger L, Horner, Gregory S, Howland, William H
Year of Publication 30.08.2005
Get full text
Year of Publication 30.08.2005
Patent
Non-contact mobile charge measurement with leakage band-bending and dipole correction
Fung, Min-Su, Verkuil, Roger L, Horner, Gregory S, Howland, William H
Year of Publication 03.08.2004
Get full text
Year of Publication 03.08.2004
Patent
Non-contact mobile charge measurement with leakage band-bending and dipole correction
Fung, Min-Su, Verkuil, Roger L, Horner, Gregory S, Howland, William H
Year of Publication 18.02.2003
Get full text
Year of Publication 18.02.2003
Patent
Plasma Charging and Damage Evaluation of Reactive Ion Etching using Surface Photovoltage Technique and Corona Pulsed Deep Depletion Technique
Nagalingami, S., Min-Su Fung, Thind, S.
Published in Proceedings of 1st International Symposium on Plasma Process-Induced Damage (1996)
Published in Proceedings of 1st International Symposium on Plasma Process-Induced Damage (1996)
Get full text
Conference Proceeding