Atomic force microscope combined with scanning tunneling microscope [AFM/STM]
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Conference Proceeding
Journal Article
Reproducible and controllable contact electrification on a thin insulator
MORITA, S, FUKANO, Y, UCHIHASHI, T, OKUSAKO, T, SUGAWARA, Y, YAMANISHI, Y, OASA, T
Published in Japanese Journal of Applied Physics (01.11.1993)
Published in Japanese Journal of Applied Physics (01.11.1993)
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Journal Article
Scanning force/tunneling microscopy as a novel technique for the study of nanometer-scale dielectric breakdown of silicon oxide layer
FUKANO, Y, SUGAWARA, Y, YAMANISHI, Y, OASA, T, MORITA, S
Published in Japanese Journal of Applied Physics (1993)
Published in Japanese Journal of Applied Physics (1993)
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Conference Proceeding
Journal Article
Time-dependent dielectric breakdown of thin silicon oxide using dense contact electrification
FUKANO, Y, HONTANI, K, UCHIHASHI, T, OKUSAKO, T, CHAYAHARA, A, SUGAWARA, Y, YAMANISHI, Y, OASA, T, MORITA, S
Published in Japanese Journal of Applied Physics (1994)
Published in Japanese Journal of Applied Physics (1994)
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Conference Proceeding
Journal Article