IN-MEMORY COMPUTATION CIRCUIT AND METHOD
LEE PO-HAO, LEE BAI HAO, FUJIWARA HIDEHIRO, CHEN YEN-HUEI, SHIH YIUN, JONATHAN TSUNG-YUNG CHANG, CHIH YU-DER
Year of Publication 26.01.2022
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Year of Publication 26.01.2022
Patent
34.4 A 3nm, 32.5TOPS/W, 55.0TOPS/mm2 and 3.78Mb/mm2 Fully-Digital Compute-in-Memory Macro Supporting INT12 × INT12 with a Parallel-MAC Architecture and Foundry 6T-SRAM Bit Cell
Fujiwara, Hidehiro, Mori, Haruki, Zhao, Wei-Chang, Khare, Kinshuk, Lee, Cheng-En, Peng, Xiaochen, Joshi, Vineet, Chuang, Chao-Kai, Hsu, Shu-Huan, Hashizume, Takeshi, Naganuma, Toshiaki, Tien, Chen-Hung, Liu, Yao-Yi, Lai, Yen-Chien, Lee, Chia-Fu, Chou, Tan-Li, Akarvardar, Kerem, Adham, Saman, Wang, Yih, Chih, Yu-Der, Chen, Yen-Huei, Liao, Hung-Jen, Chang, Tsung-Yung Jonathan
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
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Conference Proceeding
SRAM SRAM MEMORY
LIN CHIH YU, DAI CHUN JIUN, NOGUCHI HIROKI, CHEN YEN HUEI, FUJIWARA HIDEHIRO
Year of Publication 28.01.2020
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Year of Publication 28.01.2020
Patent
20.1 NVE: A 3nm 23.2TOPS/W 12b-Digital-CIM-Based Neural Engine for High-Resolution Visual-Quality Enhancement on Smart Devices
Shih, Ming-En, Hsieh, Shih-Wei, Tsai, Ping-Yuan, Lin, Ming-Hung, Tsung, Pei-Kuei, Chang, En-Jui, Liang, Jenwei, Chang, Shu-Hsin, Huang, Chung-Lun, Nian, You-Yu, Wan, Zhe, Kumar, Sushil, Xue, Cheng-Xin, Jedhe, Gajanan, Fujiwara, Hidehiro, Mori, Haruki, Chen, Chih-Wei, Huang, Po-Hua, Juan, Chih-Feng, Chen, Chung-Yi, Lin, Tsung-Yao, Wang, Ch, Chen, Chih-Cheng, Jou, Kevin
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
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Conference Proceeding
4.5 Fine Grain Assist Bias Controlled SRAM(4. Variations in Device Characteristics,<Special Survey>Dependable VLSI System)
NII, Koji, YABUUCHI, Makoto, FUJIWARA, Hidehiro, NAKANO, Hirofumi, KAWAI, Hiroyuki
Published in The Journal of Reliability Engineering Association of Japan (01.12.2013)
Published in The Journal of Reliability Engineering Association of Japan (01.12.2013)
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Journal Article
VOLTAGE REGULATOR WITH POWER RAIL TRACKING
LIN YANGSYU, MORI HARUKI, HSU YU HAO, CHENG CHITING, CHEN YEN HUEI, LIAO HUNG JEN, FUJIWARA HIDEHIRO, CHANG ZHI HAO
Year of Publication 09.08.2021
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Year of Publication 09.08.2021
Patent
SRAM VARIATION TOLERANT READ ASSIST CIRCUIT FOR SRAM
LIN CHIH YU, SINGH SAHIL PREET, CHEN YEN HUEI, LIAO HUNG JEN, PAN HSIEN YU, FUJIWARA HIDEHIRO
Year of Publication 08.07.2021
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Year of Publication 08.07.2021
Patent
15.1 A 5nm 135Mb SRAM in EUV and High-Mobility-Channel FinFET Technology with Metal Coupling and Charge-Sharing Write-Assist Circuitry Schemes for High-Density and Low-VMIN Applications
Chang, Jonathan, Chen, Yen-Huei, Chan, Gary, Cheng, Hank, Wang, Po-Sheng, Lin, Yangsyu, Fujiwara, Hidehiro, Lee, Robin, Liao, Hung-Jen, Wang, Ping-Wei, Yeap, Geoffrey, Li, Quincy
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
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Conference Proceeding
A 5-nm 254-TOPS/W 221-TOPS/mm2 Fully-Digital Computing-in-Memory Macro Supporting Wide-Range Dynamic-Voltage-Frequency Scaling and Simultaneous MAC and Write Operations
Fujiwara, Hidehiro, Mori, Haruki, Zhao, Wei-Chang, Chuang, Mei-Chen, Naous, Rawan, Chuang, Chao-Kai, Hashizume, Takeshi, Sun, Dar, Lee, Chia-Fu, Akarvardar, Kerem, Adham, Saman, Chou, Tan-Li, Sinangil, Mahmut Ersin, Wang, Yih, Chih, Yu-Der, Chen, Yen-Huei, Liao, Hung-Jen, Chang, Tsung-Yung Jonathan
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)
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Conference Proceeding
METHOD AND SYSTEM TO BALANCE GROUND BOUNCE
LIN CHIH YU, CHEN YEN HUEI, ZHAO WEI CHANG, PAN HSIEN YU, FUJIWARA HIDEHIRO
Year of Publication 11.05.2020
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Year of Publication 11.05.2020
Patent
MEMORY DEVICE AND FABRICATION METHOD OF THE SAME
LIN CHIH YU, CHAN WEI MIN, CHEN YEN HUEI, LIAO HUNG JEN, FUJIWARA HIDEHIRO
Year of Publication 07.05.2019
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Year of Publication 07.05.2019
Patent
A 4nm 6163-TOPS/W/b \mathbf/b} SRAM Based Digital-Computing-in-Memory Macro Supporting Bit-Width Flexibility and Simultaneous MAC and Weight Update
Mori, Haruki, Zhao, Wei-Chang, Lee, Cheng-En, Lee, Chia-Fu, Hsu, Yu-Hao, Chuang, Chao-Kai, Hashizume, Takeshi, Tung, Hao-Chun, Liu, Yao-Yi, Wu, Shin-Rung, Akarvardar, Kerem, Chou, Tan-Li, Fujiwara, Hidehiro, Wang, Yih, Chih, Yu-Der, Chen, Yen-Huei, Liao, Hung-Jen, Chang, Tsung-Yung Jonathan
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
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Conference Proceeding
IN-MEMORY COMPUTATION CIRCUIT AND METHOD
CHIH YU DER, SHIH YI CHUN, LEE PO HAO, CHANG JONATHAN TSUNG YUNG, CHEN YEN HUEI, LEE CHIA FU, FUJIWARA HIDEHIRO
Year of Publication 21.01.2022
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Year of Publication 21.01.2022
Patent
MEMORY ARRAY CIRCUIT AND METHOD OF MANUFACTURING SAME
LIN CHIH YU, OKUNO YASUTOSHI, CHEN YEN HUEI, LIAO HUNG JEN, PAN HSIEN YU, FUJIWARA HIDEHIRO
Year of Publication 28.01.2020
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Year of Publication 28.01.2020
Patent
MULTI WORD LINE ASSERTION
LIN CHIH YU, ZHAO WEI CHANG, CHEN YEN HUEI, PAN HSIEN YU, FUJIWARA HIDEHIRO
Year of Publication 26.12.2019
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Year of Publication 26.12.2019
Patent
STATIC RANDOM ACCESS MEMORY WITH WRITE ASSIST CIRCUIT
LIN CHIH YU, SINGH SAHIL PREET, CHEN YEN HUEI, LIAO HUNG JEN, PAN HSIEN YU, FUJIWARA HIDEHIRO
Year of Publication 26.10.2020
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Year of Publication 26.10.2020
Patent
16.4 An 89TOPS/W and 16.3TOPS/mm2 All-Digital SRAM-Based Full-Precision Compute-In Memory Macro in 22nm for Machine-Learning Edge Applications
Chih, Yu-Der, Lee, Po-Hao, Fujiwara, Hidehiro, Shih, Yi-Chun, Lee, Chia-Fu, Naous, Rawan, Chen, Yu-Lin, Lo, Chieh-Pu, Lu, Cheng-Han, Mori, Haruki, Zhao, Wei-Chang, Sun, Dar, Sinangil, Mahmut E., Chen, Yen-Huei, Chou, Tan-Li, Akarvardar, Kerem, Liao, Hung-Jen, Wang, Yih, Chang, Meng-Fan, Chang, Tsung-Yung Jonathan
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
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Conference Proceeding
Quality of a Bit (QoB): A New Concept in Dependable SRAM
Fujiwara, Hidehiro, Okumura, Shunsuke, Iguchi, Yusuke, Noguchi, Hiroki, Morita, Yasuhiro, Kawaguchi, Hiroshi, Yoshimoto, Masahiko
Published in 9th International Symposium on Quality Electronic Design (isqed 2008) (01.03.2008)
Published in 9th International Symposium on Quality Electronic Design (isqed 2008) (01.03.2008)
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Conference Proceeding
A stable chip-ID generating physical uncloneable function using random address errors in SRAM
Fujiwara, H., Yabuuchi, M., Tsukamoto, Y., Nakano, H., Owada, T., Kawai, H., Nii, K.
Published in 2012 IEEE International SOC Conference (01.09.2012)
Published in 2012 IEEE International SOC Conference (01.09.2012)
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Conference Proceeding