Universal Testing for Linear Feed-Forward/Feedback Shift Registers
FUJIWARA, Hideo, FUJIWARA, Katsuya, HOSOKAWA, Toshinori
Published in IEICE Transactions on Information and Systems (01.05.2020)
Published in IEICE Transactions on Information and Systems (01.05.2020)
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Journal Article
Synthesis and Enumeration of Generalized Shift Registers for Strongly Secure SR-Equivalents
FUJIWARA, Hideo, FUJIWARA, Katsuya
Published in IEICE Transactions on Information and Systems (01.01.2017)
Published in IEICE Transactions on Information and Systems (01.01.2017)
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Journal Article
Accumulation of Phosphorylated α-Synuclein in Aging Human Brain
SAITO, YUKO, KAWASHIMA, AKIKO, RUBERU, NYOKA N, FUJIWARA, HIDEO, KOYAMA, SHUNICHI, SAWABE, MOTOJI, ARAI, TOMIO, NAGURA, HIROSHI, YAMANOUCHI, HIROSHI, HASEGAWA, MASATO, IWATSUBO, TAKESHI, MURAYAMA, SHIGEO
Published in Journal of neuropathology and experimental neurology (01.06.2003)
Published in Journal of neuropathology and experimental neurology (01.06.2003)
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Journal Article
A Failure Prediction Strategy for Transistor Aging
Hyunbean Yi, Yoneda, T., Inoue, M., Sato, Y., Kajihara, S., Fujiwara, H.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2012)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2012)
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Journal Article
A Test Generation Method for Data Paths Using Easily Testable Functional Time Expansion Models and Controller Augmentation
Masuda, Tetsuya, Nishimaki, Jun, Hosokawa, Toshinori, Fujiwara, Hideo
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
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Conference Proceeding
Journal Article
Reconfigured Scan Forest for Test Application Cost, Test Data Volume, and Test Power Reduction
Dong Xiang, Kaiwei Li, Jiaguang Sun, Fujiwara, H.
Published in IEEE transactions on computers (01.04.2007)
Published in IEEE transactions on computers (01.04.2007)
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Journal Article
Accumulation of phosphorylated alpha-synuclein in the brain and peripheral ganglia of patients with multiple system atrophy
Nishie, Makoto, Mori, Fumiaki, Fujiwara, Hideo, Hasegawa, Masato, Yoshimoto, Makoto, Iwatsubo, Takeshi, Takahashi, Hitoshi, Wakabayashi, Koichi
Published in Acta neuropathologica (01.04.2004)
Published in Acta neuropathologica (01.04.2004)
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Journal Article
A Nonscan Design-for-Testability Method for Register-Transfer-Level Circuits to Guarantee Linear-Depth Time Expansion Models
Fujiwara, H., Iwata, H., Yoneda, T., Chia Yee Ooi
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2008)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2008)
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Journal Article
F-Scan: A DFT Method for Functional Scan at RTL
OBIEN, Marie Engelene J., OHTAKE, Satoshi, FUJIWARA, Hideo
Published in IEICE Transactions on Information and Systems (01.01.2011)
Published in IEICE Transactions on Information and Systems (01.01.2011)
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Journal Article
Raman spectroscopic study on the local structure around O2 in supercritical water
Sugimoto, Kazuko, Fujiwara, Hideo, Koda, Seiichiro
Published in The Journal of supercritical fluids (01.12.2004)
Published in The Journal of supercritical fluids (01.12.2004)
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Journal Article
Faster-than-at-speed test for increased test quality and in-field reliability
Yoneda, T., Hori, K., Inoue, M., Fujiwara, H.
Published in 2011 IEEE International Test Conference (01.09.2011)
Published in 2011 IEEE International Test Conference (01.09.2011)
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Conference Proceeding