Field-Plate Structure Dependence of Current Collapse Phenomena in High-Voltage GaN-HEMTs
Saito, Wataru, Kakiuchi, Yorito, Nitta, Tomohiro, Saito, Yasunobu, Noda, Takao, Fujimoto, Hidetoshi, Yoshioka, Akira, Ohno, Tetsuya, Yamaguchi, Masakazu
Published in IEEE electron device letters (01.07.2010)
Published in IEEE electron device letters (01.07.2010)
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