Mechanism of Threshold Voltage Shift (Δ V th ) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs
Liu, Chuan-Hsi, Lee, Ming T., Lin, Chih-Yung, Chen, Jenkon, Loh, Y. T., Liou, Fu-Tai, Schruefer, Klaus, Katsetos, Anastasios A., Yang, Zhijian, Rovedo, Nivo, Hook, Terence B., Wann, Clement, Chen, Tze-Chiang
Published in Japanese Journal of Applied Physics (2002)
Published in Japanese Journal of Applied Physics (2002)
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Journal Article
Stability of semiconducting TiO2 photoanodes
FU-TAI LIOU, YANG, C. Y, LEVINE, S. N
Published in Journal of the Electrochemical Society (01.04.1983)
Published in Journal of the Electrochemical Society (01.04.1983)
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Journal Article
Extending the reliability scaling limit of gate dielectrics through remote plasma nitridation of N2O-Grown oxides and NO RTA treatment
LIU, Chuan H, LIN, Hsiu-Shan, LEE, J. H, HUANG, M, HSIUNG, Chiung-Sheng, HUANG-LU, S, HSU, Chen-Chung, LIANG, Alan Y, JENKON CHEN, HSIEH, W. Y, YEN, P. W, CHIEN, S. C, LIN, Yu-Yin, LOH, Y. T, CHANG, Yih J, LIOU, Fu-Tai, CHEN, M. G, PAN, T. M, KAO, C. J, HUANG, K. T, LIN, S. H, SHENG, Y. C, CHANGE, Wen-Tung
Year of Publication 2002
Year of Publication 2002
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Conference Proceeding
Thin dielectric quality/yield study using a constant voltage ramp method
BRYANT, F, LIOU, F.-T, HAN, Y.-P, BARNES, J. J
Published in Journal of the Electrochemical Society (1989)
Published in Journal of the Electrochemical Society (1989)
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Journal Article
Photoelectrolysis at Fe2 O 3 / TiO2 Heterojunction Electrode
Liou, Fu‐Tai, Yang, Chiang Y., Levine, Sumner N.
Published in Journal of the Electrochemical Society (01.02.1982)
Published in Journal of the Electrochemical Society (01.02.1982)
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Journal Article