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Published in IEEE transactions on nuclear science (01.12.2011)
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Record RF performance of 45-nm SOI CMOS Technology
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Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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A highly rugged 19 dBm 28GHz PA using novel PAFET device in 45RFSOI technology achieving peak efficiency above 48
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Novel mmWave NMOS Device for High Pout mmWave Power Amplifiers in 45RFSOI
Jain, Sameer H., Lederer, Dimitri, Kumar, Arvind, Saroop, Sudesh, Prindle, Chris, Srinivasan, P., Liu, Wen, Achanta, Ravi, Kaltalioglu, Erdem, Moss, Stephen, Freeman, Greg, Colestock, Paul
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
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Performance of V-Band On-Chip Antennas in GlobalFoundries 45nm CMOS SOI Process for Mm-Wave 5G Applications
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Published in 2018 IEEE/MTT-S International Microwave Symposium - IMS (01.06.2018)
Published in 2018 IEEE/MTT-S International Microwave Symposium - IMS (01.06.2018)
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동적 레벨링 프로세스 가열기 리프트
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Impact of Technology Scaling in sub-100 nm nMOSFETs on Total-Dose Radiation Response and Hot-Carrier Reliability
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Published in IEEE transactions on nuclear science (01.06.2014)
Published in IEEE transactions on nuclear science (01.06.2014)
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Krithivasan, R., Yuan Lu, Cressler, J.D., Jae-Sung Rieh, Khater, M.H., Ahlgren, D., Freeman, G.
Published in IEEE electron device letters (01.07.2006)
Published in IEEE electron device letters (01.07.2006)
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An Investigation of Single Event Transient Response in 45-nm and 32-nm SOI RF-CMOS Devices and Circuits
England, Troy D., Arora, Rajan, Fleetwood, Zachary E., Lourenco, Nelson E., Moen, Kurt A., Cardoso, Adilson S., McMorrow, Dale, Roche, Nicolas J.-H, Warner, Jeffery H., Buchner, Stephen P., Paki, Pauline, Sutton, Akil K., Freeman, Greg, Cressler, John D.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Freeman, Greg J., Caramanis, Constantine, Bovik, Alan C.
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Published in 2014 Southwest Symposium on Image Analysis and Interpretation (01.04.2014)
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Lifting transformational models of product lines: a case study
Freeman, Greg, Batory, Don, Lavender, Greg, Sarvela, Jacob Neal
Published in Software and systems modeling (01.06.2010)
Published in Software and systems modeling (01.06.2010)
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A simple four-port parasitic deembedding methodology for high-frequency scattering parameter and noise characterization of SiGe HBTs
Qingqing Liang, Cressler, J.D., Guofu Niu, Yuan Lu, Freeman, G., Ahlgren, D.C., Malladi, R.M., Newton, K., Harame, D.L.
Published in IEEE transactions on microwave theory and techniques (01.11.2003)
Published in IEEE transactions on microwave theory and techniques (01.11.2003)
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SiGe heterojunction bipolar transistors and circuits toward terahertz communication applications
Jae-Sung Rieh, Jagannathan, B., Greenberg, D.R., Meghelli, M., Rylyakov, A., Guarin, F., Zhijian Yang, Ahlgren, D.C., Freeman, G., Cottrell, P., Harame, D.
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Cryogenic operation of third-generation, 200-GHz Peak-fT, silicon-germanium heterojunction bipolar transistors
BANERJEE, Bhaskar, VENKATARAMAN, Sunitha, FREEMAN, Greg, AHLGREN, David C, YUAN LU, QINGQING LIANG, LEE, Chang-Ho, NUTTINCK, Sebastien, HEO, Dekhyuon, CHEN, Yi-Jan Emery, CRESSLER, John D, LASKAR, Joy
Published in IEEE transactions on electron devices (01.04.2005)
Published in IEEE transactions on electron devices (01.04.2005)
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