High voltage pump circuit with reduced oxide stress
FIESTER; MARK, COSTELLO; JOHN, TRAN; STEPHANIE, LIN; GUU, HUNG; CHUAN-YUNG
Year of Publication 06.06.2000
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Year of Publication 06.06.2000
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Reducing I/O noise when leaving programming mode
RANGASAYEE KRISHNA, FIESTER MARK W, BIELBY ROBERT R. N, WONG MYRON W, COSTELLO JOHN C, VEST W. BRADLEY
Year of Publication 05.06.2001
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Year of Publication 05.06.2001
Patent