Search Results - "FANG, Tsung-Pao" :: K.UTB vyhledávací portál

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Delaunay triangulation in three dimensions

by Tsung-Pao Fang, Piegl, L.A.
Published in IEEE computer graphics and applications (01.09.1995)

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PATTERN MATCHING METHOD

by LIN, Wei-Chou, SONG, Chao, FANG, Tsung-Pao, LIN, Hao
Year of Publication 27.04.2023

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FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR MANUFACTURING

by LIN, Wei-Yin, LIU, Meng, FANG, Tsung-Pao, YAN, Fei, SUN, Rencheng, CHEN, Been-Der
Year of Publication 24.08.2023

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PATTERN MATCHING METHOD

by LIN, WEIOU, FANG, TSUNG-PAO, SONG, CHAO, LIN, HAO
Year of Publication 21.06.2024

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Pattern matching method

by LIN, WEIOU, FANG, TSUNG-PAO, SONG, CHAO, LIN, HAO
Year of Publication 01.02.2024

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Field of view selection for metrology associated with semiconductor manufacturing

by SUN, RENNG, CHEN, BEEN-DER, FANG, TSUNG-PAO, YAN, FEI, LIN, WEI-YIN, LIU, MENG
Year of Publication 01.12.2023

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Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer

by FANG TSUNG-PAO, SHIFRIN EUGENE, CHEN CHIEN-HUEI (ADAM), WANG XIAOMING
Year of Publication 03.07.2012

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Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer

by Chen, Chien-Huei (Adam), Wang, Xiaoming, Shifrin, Eugene, Fang, Tsung-Pao
Year of Publication 03.07.2012

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Methods and systems for determining a defect criticality index for defects on wafers

by Chen, Chien-Huei (Adam), Xiong, Yan, Zhang, Jianxin, Chang, Ellis, Fang, Tsung-Pao
Year of Publication 20.03.2012

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Methods and systems for determining a defect criticality index for defects on wafers

by FANG TSUNG-PAO, CHEN CHIEN-HUEI (ADAM), CHANG ELLIS, XIONG YAN, ZHANG JIANXIN
Year of Publication 20.03.2012

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METHODS FOR ACCURATE IDENTIFICATION OF AN EDGE OF A CARE AREA FOR AN ARRAY AREA FORMED ON A WAFER AND METHODS FOR BINNING DEFECTS DETECTED IN AN ARRAY AREA FORMED ON A WAFER

by FANG TSUNG-PAO, SHIFRIN EUGENE, CHEN CHIEN-HUEI (ADAM), WANG XIAOMING
Year of Publication 16.06.2011

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Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer

by FANG TSUNG-PAO, SHIFRIN EUGENE, CHEN CHIEN-HUEI (ADAM), WANG XIAOMING
Year of Publication 22.02.2011

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Methods for accurate identification of an edge of a care area for an array area formed on a wafer and methods for binning defects detected in an array area formed on a wafer

by Chen, Chien-Huei (Adam), Wang, Xiaoming, Shifrin, Eugene, Fang, Tsung-Pao
Year of Publication 22.02.2011

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Patent

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METHODS AND SYSTEMS FOR DETERMINING A DEFECT CRITICALITY INDEX FOR DEFECTS ON WAFERS

by CHANG, ELLIS, FANG, TSUNG-PAO, CHEN, CHIEN-HUEI (ADAM), XIONG, YAN, ZHANG, JIANXIN
Year of Publication 21.01.2010

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METHODS AND SYSTEMS FOR DETERMINING A DEFECT CRITICALITY INDEX FOR DEFECTS ON WAFERS

by CHANG, ELLIS, FANG, TSUNG-PAO, CHEN, CHIEN-HUEI (ADAM), XIONG, YAN, ZHANG, JIANXIN
Year of Publication 22.10.2009

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METHODS AND SYSTEMS FOR DETERMINING A DEFECT CRITICALITY INDEX FOR DEFECTS ON WAFERS

by FANG TSUNG-PAO, CHEN CHIEN-HUEI (ADAM), CHANG ELLIS, XIONG YAN, ZHANG JIANXIN
Year of Publication 15.10.2009

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METHODS FOR ACCURATE IDENTIFICATION OF AN EDGE OF A CARE AREA FOR AN ARRAY AREA FORMED ON A WAFER AND METHODS FOR BINNING DEFECTS DETECTED IN AN ARRAY AREA FORMED ON A WAFER

by FANG, TSUNG-PAO, WANG, XIAMING, SHIFRIN, EUGENE, CHEN, CHIEN-HUEI (ADAM)
Year of Publication 04.09.2008

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METHODS FOR ACCURATE IDENTIFICATION OF AN EDGE OF A CARE AREA FOR AN ARRAY AREA FORMED ON A WAFER AND METHODS FOR BINNING DEFECTS DETECTED IN AN ARRAY AREA FORMED ON A WAFER

by FANG TSUNG-PAO, SHIFRIN EUGENE, CHEN CHIEN-HUEI (ADAM), WANG XIAOMING
Year of Publication 28.08.2008

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Patent

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Triangulation of random and scattered data

by FANG; TSUNG-PAO, PIEGL; LES
Year of Publication 27.06.1995

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Delaunay triangulation using a uniform grid

by Fang, T.-P., Piegl, L.A.
Published in IEEE computer graphics and applications (01.05.1993)

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