Non-contact scanning probe technique for electric field measurements based on nanowire field-effect transistor
Trifonov, A.S., Presnov, D.E., Bozhev, I.V., Evplov, D.A., Desmaris, V., Krupenin, V.A.
Published in Ultramicroscopy (01.08.2017)
Published in Ultramicroscopy (01.08.2017)
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Journal Article
TEST STRUCTURE FOR GRADUATING SCANNING PROBING MICROSCOPE
EVPLOV D.A, MEDVEDEV B.K, REDCHENKO V.V, SAUNIN S.A, EMEL'CHENKO G.A, MASALOV V.M, BYKOV V.A
Year of Publication 10.01.2005
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Year of Publication 10.01.2005
Patent