Accuracy of analyses of microelectronics nanostructures in atom probe tomography
Vurpillot, F, Rolland, N, Estivill, R, Duguay, S, Blavette, D
Published in Semiconductor science and technology (01.07.2016)
Published in Semiconductor science and technology (01.07.2016)
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Association between questionnaire anxiety traits and in-game behavioural inhibition
Estivill, R. Mateu, Fullana, M.A., Peña-Arteaga, V. de la, Juaneda-Seguí, A., Chavarría-Elizondo, P., Martínez-Zalacaín, I., Torrents-Rodas, D., Bach, D.R., Soriano-Mas, C.
Published in Neuroscience Applied (2022)
Published in Neuroscience Applied (2022)
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