An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS
Lourenco, Nelson E., Phillips, Stanley D., England, Troy D., Cardoso, Adilson S., Fleetwood, Zachary E., Moen, Kurt A., McMorrow, Dale, Warner, Jeffrey H., Buchner, Stephen P., Paki-Amouzou, Pauline, Pekarik, Jack, Harame, David, Raman, Ashok, Turowski, Marek, Cressler, John D.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
A SiGe 8-18-GHz Receiver With Built-In-Testing Capability for Self-Healing Applications
Howard, Duane C., Saha, Prabir K., Shankar, Subramaniam, England, Troy D., Cardoso, Adilson S., Diestelhorst, Ryan M., Seungwoo Jung, Cressler, John D.
Published in IEEE transactions on microwave theory and techniques (01.10.2014)
Published in IEEE transactions on microwave theory and techniques (01.10.2014)
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Journal Article
An 8-16 GHz SiGe Low Noise Amplifier With Performance Tuning Capability for Mitigation of Radiation-Induced Performance Loss
Howard, D. C., Saha, P. K., Shankar, S., Diestelhorst, R. M., England, T. D., Lourenco, N. E., Kenyon, E., Cressler, J. D.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Single-Event Transient and Total Dose Response of Precision Voltage Reference Circuits Designed in a 90-nm SiGe BiCMOS Technology
Cardoso, Adilson S., Chakraborty, Partha S., Karaulac, Nedeljko, Fleischhauer, David M., Lourenco, Nelson E., Fleetwood, Zachary E., Omprakash, Anup P., England, Troy D., Jung, Seungwoo, Najafizadeh, Laleh, Roche, Nicolas J.-H, Khachatrian, Ani, Warner, Jeffrey H., McMorrow, Dale, Buchner, Stephen P., En Xia Zhang, Cher Xuan Zhang, McCurdy, Michael W., Reed, Robert A., Fleetwood, Daniel M., Paki-Amouzou, Pauline, Cressler, John D.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits
Jung, Seungwoo, McMorrow, Dale, Buchner, Stephen P., Melinger, Joseph S., Warner, Jeffrey H., Paki-Amouzou, Pauline, Babcock, Jeff A., Cressler, John D., Lourenco, Nelson E., Song, Ickhyun, Oakley, Michael A., England, Troy D., Arora, Rajan, Cardoso, Adilson S., Roche, Nicolas J.-H., Khachatrian, Ani
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Evaluating the Effects of Single Event Transients in FET-Based Single-Pole Double-Throw RF Switches
Cardoso, Adilson S., Chakraborty, Partha S., Lourenco, Nelson E., England, Troy D., Saha, Prabir, Howard, Duane C., Fleischhauer, David M., Warner, Jeffrey H., McMorrow, Dale, Buchner, Stephen P., Paki-Amouzou, Pauline, Thrivikraman, Tushar K., Cressler, John D.
Published in IEEE transactions on nuclear science (01.04.2014)
Published in IEEE transactions on nuclear science (01.04.2014)
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Journal Article
On the Transient Response of a Complementary (npn + pnp) SiGe HBT BiCMOS Technology
Lourenco, Nelson E., Fleetwood, Zachary E., Seungwoo Jung, Cardoso, Adilson S., Chakraborty, Partha S., England, Troy D., Roche, Nicolas J.-H, Khachatrian, Ani, McMorrow, Dale, Buchner, Stephen P., Melinger, Joseph S., Warner, Jeffrey H., Paki, Pauline, Kaynak, Mehmet, Tillack, Bernd, Knoll, Dieter, Cressler, John D.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
An Investigation of Single Event Transient Response in 45-nm and 32-nm SOI RF-CMOS Devices and Circuits
England, Troy D., Arora, Rajan, Fleetwood, Zachary E., Lourenco, Nelson E., Moen, Kurt A., Cardoso, Adilson S., McMorrow, Dale, Roche, Nicolas J.-H, Warner, Jeffery H., Buchner, Stephen P., Paki, Pauline, Sutton, Akil K., Freeman, Greg, Cressler, John D.
Published in IEEE transactions on nuclear science (01.12.2013)
Published in IEEE transactions on nuclear science (01.12.2013)
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Journal Article
Mitigation of Total Dose Performance Degradation in an 8-18 GHz SiGe Reconfigurable Receiver
Howard, Duane C., Cardoso, Adilson S., Fleetwood, Zachary E., Lourenco, Nelson E., England, Troy D., Saha, Prabir K., Shankar, Subramaniam, Diestelhorst, Ryan M., En Xia Zhang, Cher Xuan Zhang, Paki-Amouzou, Pauline, Cressler, John D.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
An Investigation of the SET Response of Devices and Differential Pairs in a 32-nm SOI CMOS Technology
Fleetwood, Zachary E., Lourenco, Nelson E., Ildefonso, Adrian, England, Troy D., Song, Ickhyun, Schmid, Robert L., Cardoso, Adilson S., Jung, Seungwoo, Roche, Nicolas J.-H, Khachatrian, Ani, Buchner, Steven P., McMorrow, Dale, Warner, Jeffrey, Paki, Pauline, Cressler, John D.
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Total Ionizing Dose Response of Triple-Well FET-Based Wideband, High-Isolation RF Switches in a 130 nm SiGe BiCMOS Technology
Cardoso, Adilson S., Chakraborty, Partha S., Lourenco, Nelson E., Song, Peter, England, Troy D., Kenyon, Eleazar W., Karaulac, Nedeljko, Cressler, John D.
Published in IEEE transactions on nuclear science (01.08.2013)
Published in IEEE transactions on nuclear science (01.08.2013)
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Journal Article
An on-chip SiGe HBT characterization circuit for use in self-healing RF systems
Howard, Duane C., England, Troy D., Lourenco, Nelson E., Cardoso, Adilson S., Cressler, John D.
Published in 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.09.2013)
Published in 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.09.2013)
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Conference Proceeding
A complementary SiGe HBT on SOI low dropout voltage regulator utilizing a nulling resistor
Seungwoo Jung, England, Troy D., Ickhyun Song, Wier, Bryan, Cressler, John D., Babcock, Jeff A.
Published in 2014 IEEE International Symposium on Circuits and Systems (ISCAS) (01.06.2014)
Published in 2014 IEEE International Symposium on Circuits and Systems (ISCAS) (01.06.2014)
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Conference Proceeding
Total Dose and Transient Response of SiGe HBTs from a New 4th-Generation, 90 nm SiGe BiCMOS Technology
Lourenco, N. E., Schmid, R. L., Moen, K. A., Phillips, S. D., England, T. D., Cressler, J. D., Pekarik, J., Adkisson, J., Camillo-Castillo, R., Cheng, P., Monaghan, J. E., Gray, P., Harame, D., Khater, M., Liu, Q., Vallett, A., Zetterlund, B., Jain, V., Kaushal, V.
Published in 2012 IEEE Radiation Effects Data Workshop (01.07.2012)
Published in 2012 IEEE Radiation Effects Data Workshop (01.07.2012)
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Conference Proceeding
On-die self-healing of mixer image-rejection ratio for mixed-signal electronic systems
Shankar, S., Saha, P., Howard, D. C., Diestelhorst, R., England, T. D., Cardoso, A. S., Cressler, J. D.
Published in 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.09.2012)
Published in 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.09.2012)
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Conference Proceeding
Cold-capable SiGe BiCMOS wireline transceivers for distributed electronics systems
England, T. D., Chatterjee, C., Diestelhorst, R. M., Cressler, J. D., Finn, S., Najafizadeh, L.
Published in 2012 IEEE Aerospace Conference (01.03.2012)
Published in 2012 IEEE Aerospace Conference (01.03.2012)
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Conference Proceeding
Wide-tuning range, amplitude-locked test signal source for self-healing, mixed-signal electronic systems
Shankar, S., Horst, S. J., Saha, P., Howard, D. C., Diestelhorst, R., England, T. D., Cressler, J. D.
Published in 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2011)
Published in 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2011)
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Conference Proceeding
Advanced SiGe BiCMOS Technology for Multi-Mrad Electronic Systems
Fleetwood, Zachary E., Kenyon, Eleazar W., Lourenco, Nelson E., Jain, Shaleen, En Xia Zhang, England, Troy D., Cressler, John D., Schrimpf, Ronald D., Fleetwood, Daniel M.
Published in IEEE transactions on device and materials reliability (01.09.2014)
Published in IEEE transactions on device and materials reliability (01.09.2014)
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Magazine Article
A new approach to designing electronic systems for operation in extreme environments: Part I - The SiGe Remote Sensor Interface
Diestelhorst, R. M., England, T. D., Berger, R., Garbos, R., Ulaganathan, C., Blalock, B., Cornett, K., Mantooth, A., Xueyang Geng, Dai, F., Johnson, W., Holmes, J., Alles, M., Reed, R., McCluskey, P., Mojarradi, M., Peltz, L., Frampton, R., Eckert, C., Cressler, J. D.
Published in IEEE aerospace and electronic systems magazine (01.06.2012)
Published in IEEE aerospace and electronic systems magazine (01.06.2012)
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Magazine Article