Effect of emitter-base bias during pre-irradiation infrared illumination on the radiation response of bipolar transistors
Pershenkov, V.S., Bashin, A.Y., Zebrev, G.I., Avdeev, S.V., Belyakov, V.V., Ulimov, V.N., Emelianov, V.V.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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Journal Article
Effect of aging on radiation response of bipolar transistors
Pershenkov, V.S., Slesarev, A.Y., Sogoyan, A.V., Belyakov, V.V., Kekukh, V.B., Bashin, A.Y., Ivashin, D.V., Motchkine, V.S., Ulimov, V.N., Emelianov, V.V.
Published in IEEE transactions on nuclear science (01.12.2001)
Published in IEEE transactions on nuclear science (01.12.2001)
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Journal Article
2-Morpholino-5-Phenyl-6H-1,3,4-Thiadiazine Corrects Metabolic Disorders during the Development of Alloxan Diabetes Mellitus in Rats
Emelianov, V. V., Savateeva, E. A., Sidorova, L. P., Tseitler, T. A., Gette, I. F., Bulavintseva, T. S., Smirnykh, S. E., Maksimova, N. E., Mochulskaya, N. N., Chupakhin, O. N., Chereshnev, V. A.
Published in Bulletin of experimental biology and medicine (01.11.2016)
Published in Bulletin of experimental biology and medicine (01.11.2016)
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Journal Article
The effect of emitter junction bias on the low dose-rate radiation response of bipolar devices
Pershenkov, V.S., Maslov, V.B., Cherepko, S.V., Shvetzov-Shilovsky, I.N., Belyakov, V.V., Sogoyan, A.V., Rusanovsky, V.I., Ulimov, V.N., Emelianov, V.V., Nasibullin, V.S.
Published in IEEE transactions on nuclear science (01.12.1997)
Published in IEEE transactions on nuclear science (01.12.1997)
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Journal Article
Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response
Pershenkov, V.S., Avdeev, S.V., Tsimbalov, A.S., Levin, M.N., Belyakov, V.V., Ivashin, D.V., Slesarev, A.Y., Bashin, A.Y., Zebrev, G.I., Ulimov, V.N., Emelianov, V.V.
Published in Microelectronics and reliability (01.04.2002)
Published in Microelectronics and reliability (01.04.2002)
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Journal Article
Effect of electron traps on reversibility of annealing
Pershenkov, V.S., Belyakov, V.V., Cherepko, S.V., Nikiforov, A.Y., Sogoyan, A.V., Ulimov, V.N., Emelianov, V.V.
Published in IEEE transactions on nuclear science (01.12.1995)
Published in IEEE transactions on nuclear science (01.12.1995)
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Journal Article
Physical model of single heavy ION induced hard errors
Useinov, R.G., Zebrev, G.I., Emelianov, V.V., Persbenkov, V.S., Ulimov, V.N.
Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
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Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
Conference Proceeding
Buildup and annealing of interface traps under the influence of low-dose rate space irradiation taking into account high-frequency gate bias switches
Zebrev, G.I., Pershenkov, V.S., Shvetzov-Shilovsky, I.N., Morozov, I.S., Ulimov, V.N., Emelianov, V.V.
Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
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Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
Conference Proceeding
Reversible positive charge annealing in MOS transistor during variety of electrical and thermal stresses
Emelianov, V.V., Zebrev, G.I., Ulimov, V.N., Useinov, R.G., Belyakov, V.V., Pershenkov, V.S.
Published in Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems (1995)
Published in Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems (1995)
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Conference Proceeding
Thermal- and radiation-induced interface traps in MOS devices
Sogoyan, A.V., Cherepko, S.V., Pershenkov, V.S., Rogov, V.I., Ulimov, V.N., Emelianov, V.V.
Published in RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) (1997)
Published in RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) (1997)
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Conference Proceeding
The simulation of the low dose-rate radiation effect in bipolar devices
Pershenkov, V.S., Cherepko, S.V., Belyakov, V.V., Abramov, V.V., Rusanovsky, V.I., Sogoyan, A.V., Rogov, V.I., Ulimov, V.N., Emelianov, V.V., Nasibullin, V.S.
Published in RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) (1997)
Published in RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) (1997)
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Conference Proceeding
Thermal and field dependencies of latent relaxation processes in irradiated MOS devices
Emelianov, V.V., Sogoyan, A.V., Cherepko, S.V., Meshurov, O.V., Ulimov, V.N., Chumakov, A.I., Rogov, V.I., Nikiforov, A.Y.
Published in RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) (1997)
Published in RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) (1997)
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Conference Proceeding