Transient fault models and AVF estimation revisited
George, N J, Elks, C R, Johnson, B W, Lach, J
Published in 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) (01.06.2010)
Published in 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) (01.06.2010)
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Conference Proceeding
Bit-slice logic interleaving for spatial multi-bit soft-error tolerance
George, N J, Elks, C R, Johnson, B W, Lach, J
Published in 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) (01.06.2010)
Published in 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) (01.06.2010)
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Conference Proceeding
Application of a fault injection based dependability assessment process to a commercial safety critical nuclear reactor protection system
Elks, C R, Reynolds, M, George, N, Miklo, M, Bingham, S, Williams, R, Johnson, B W, Waterman, M, Dion, J
Published in 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) (01.06.2010)
Published in 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN) (01.06.2010)
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Conference Proceeding
Design of a high performance FPGA based fault injector for real-time safety-critical systems
Miklo, M., Elks, C. R., Williams, R. D.
Published in ASAP 2011 - 22nd IEEE International Conference on Application-specific Systems, Architectures and Processors (01.09.2011)
Published in ASAP 2011 - 22nd IEEE International Conference on Application-specific Systems, Architectures and Processors (01.09.2011)
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Conference Proceeding
Reliability analysis of hard real-time systems in the presence of controller malfunctions
Elks, C.R., Bechta Dugan, J., Johnson, B.W.
Published in Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) (2000)
Published in Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) (2000)
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Conference Proceeding
System level error models for safety critical control systems
Elks, C.R., Johnson, B.W., Perrone, P.G.
Published in Proceedings of the 1998 American Control Conference. ACC (IEEE Cat. No.98CH36207) (1998)
Published in Proceedings of the 1998 American Control Conference. ACC (IEEE Cat. No.98CH36207) (1998)
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