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"Elkayam, Shalom"
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"Elkayam, Shalom"
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GENERATING TRAINING DATA USABLE FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
by
ELKAYAM SHALOM
,
STEIMAN MATAN
Year of Publication
07.02.2022
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반도체 시편의 검사
by
COHEN SHAUL
,
ALUMOT DROR
,
ELKAYAM SHALOM
Year of Publication
07.12.2022
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DETERMINATION OF DEFECTS AND/OR EDGE ROUGHNESS IN A SPECIMEN BASED ON A REFERENCE IMAGE
by
ZAC NOAM
,
COHEN SHAUL
,
ELKAYAM SHALOM
Year of Publication
21.07.2022
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MACHINE LEARNING BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND TRAINING THEREOF
by
COHEN SHAUL
,
BEN SHLOMO TAL
,
ELKAYAM SHALOM
,
PELED TOMER HAIM
Year of Publication
06.10.2023
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SEGMENTATION OF AN IMAGE OF A SEMICONDUCTOR SPECIMEN
by
BEN BARUCH ELAD
,
COHEN SHAUL
,
BEN SHLOMO TAL
,
ELKAYAM SHALOM
Year of Publication
06.01.2022
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GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
by
BEN BARUCH ELAD
,
COHEN SHAUL
,
BEN SHLOMO TAL
,
ELKAYAM SHALOM
Year of Publication
05.01.2022
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Generating training data usable for examination of a semiconductor specimen
by
Steiman, Matan
,
Elkayam
,
Shalom
Year of Publication
27.02.2024
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GENERATING TRAINING DATA USABLE FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
by
Steiman, Matan
,
Elkayam
,
Shalom
Year of Publication
01.12.2022
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Generating training data usable for examination of a semiconductor specimen
by
Steiman, Matan
,
Elkayam
,
Shalom
Year of Publication
20.09.2022
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GENERATING TRAINING DATA USABLE FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
by
ELKAYAM
,
Shalom
,
STEIMAN, Matan
Year of Publication
03.02.2022
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Determination of defects and/or edge roughness in a specimen based on a reference image
by
Zac, Noam
,
Elkayam
,
Shalom
,
Cohen, Shaul
Year of Publication
26.12.2023
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EXAMINATION OF A SEMICONDUCTOR SPECIMEN
by
ELKAYAM
,
Shalom
,
COHEN, Shaul
,
ALUMOT, Dror
Year of Publication
08.02.2023
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DETERMINATION OF DEFECTS AND/OR EDGE ROUGHNESS IN A SPECIMEN BASED ON A REFERENCE IMAGE
by
ELKAYAM
,
Shalom
,
COHEN, Shaul
,
ZAC, Noam
Year of Publication
14.07.2022
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MACHINE LEARNING BASED EXAMINATION OF A SEMICONDUCTOR SPECIMEN AND TRAINING THEREOF
by
BEN-SHLOMO, Tal
,
ELKAYAM
,
Shalom
,
COHEN, Shaul
,
PELED, Tomer
Year of Publication
28.09.2023
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EXAMINATION OF A SEMICONDUCTOR SPECIMEN
by
ELKAYAM
,
Shalom
,
COHEN, Shaul
,
ALUMOT, Dror
Year of Publication
07.10.2021
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Segmentation of an image of a semiconductor specimen
by
Ben-Shlomo, Tal
,
Ben Baruch, Elad
,
Elkayam
,
Shalom
,
Cohen, Shaul
Year of Publication
18.04.2023
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Examination of a semiconductor specimen
by
Alumot, Dror
,
Elkayam
,
Shalom
,
Cohen, Shaul
Year of Publication
01.06.2021
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Examination of a semiconductor specimen
by
ALUMOTOR
,
COHEN, SHAUL
,
ELKAYAM
,
SHALOM
Year of Publication
11.06.2024
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Generating training data usable for examination of a semiconductor specimen
by
STEIMAN, MATAN
,
ELKAYAM
,
SHALOM
Year of Publication
01.06.2022
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GENERATING TRAINING DATA USABLE FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
by
ELKAYAM SHALOM
,
STEIMAN MATAN
Year of Publication
25.02.2022
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