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Optimal experimental design of STEM measurement of atom column positions
Van Aert, S., den Dekker, A.J., Van Dyck, D., van den Bos, A.
Published in Ultramicroscopy (01.04.2002)
Published in Ultramicroscopy (01.04.2002)
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Does a monochromator improve the precision in quantitative HRTEM?
den Dekker, A.J., Van Aert, S., Van Dyck, D., van den Bos, A., Geuens, P.
Published in Ultramicroscopy (01.11.2001)
Published in Ultramicroscopy (01.11.2001)
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Local lattice distortions in spherical carbon nanoparticles as studied by HRTEM image analysis
Romeo, M, Arnault, J.C, Ehret, G, Banhart, F, Normand, F.Le
Published in Ultramicroscopy (01.08.2002)
Published in Ultramicroscopy (01.08.2002)
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Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy: An introduction to the proceedings of the second international symposium and workshop on emission microscopy and related techniques
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Extrapolation procedures in Mott electron polarimetry
Gay, T. J., Khakoo, M. A., Brand, J. A., Furst, J. E., Wijayaratna, W. M. K. P., Meyer, W. V., Dunning, F. B.
Published in Review of scientific instruments (01.01.1992)
Published in Review of scientific instruments (01.01.1992)
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Measurement of foil thickness in transmission electron microscopy
Pan, Zhenpeng, Davies, C. K. L., Stevens, R. N.
Published in Journal of materials science (01.04.1994)
Published in Journal of materials science (01.04.1994)
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Structural analysis of the 7.5 GeV superconducting dipole for the CEBAF High Momentum Spectrometer
Wines, R., Brindza, P., Fowler, M., Lassiter, S., Baumann, F., Bogensberger, P., Maix, R.K., Ramsauer, F., Umschaden, A.
Published in IEEE transactions on applied superconductivity (01.03.1993)
Published in IEEE transactions on applied superconductivity (01.03.1993)
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