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ELECTRICAL CHARACTERISTIC INSPECTION DEVICE FOR SEMICONDUCTOR DEVICE AND ELECTRICAL CHARACTERISTIC INSPECTION METHOD FOR SEMICONDUCTOR DEVICE
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Determining a frequency for TTFields treatment based on an electrical characteristic of targeted cancer cells
Year of Publication 17.01.2023
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ELECTRONIC DEVICE HAVING A PROGRAMMED ELECTRICAL CHARACTERISTIC
HOVLAND BJORN, GETTINGS ADAM M, JOSHI NINA S, ZHENG YI, STEVENS ANDREW G, IVERS LUCAS
Year of Publication 04.02.2016
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Year of Publication 04.02.2016
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Electrical characteristic measurement device
KATSUMOTO YOICHI, HAYASHI YOSHIHITO, BRUN MARCAURELE, TOYOIZUMI TEPPEI
Year of Publication 16.09.2015
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Year of Publication 16.09.2015
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Determining a Frequency for TTFields Treatment Based on an Electrical Characteristic of Targeted Cancer Cells
Year of Publication 25.02.2020
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ELECTRICAL CHARACTERISTIC MEASUREMENT DEVICE
KATSUMOTO YOICHI, HAYASHI YOSHIHITO, BRUN MARCAURELE, TOYOIZUMI TEPPEI
Year of Publication 24.07.2014
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Year of Publication 24.07.2014
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