EOS analysis of soldering iron tip voltage
Baumgartner, G., Smith, J.S.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
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Conference Proceeding
Magneto optical static event detector
Jacksen, N., Tan, W., Boehm, D.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
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Conference Proceeding
Human body capacitance: static or dynamic concept? [ESD]
Jonassen, N.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
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Conference Proceeding
Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
Russ, C., Bock, K., Rasras, M., De Wolf, I., Groeseneken, G., Maes, H.E.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
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Conference Proceeding
Pitfalls when correlating TLP, HBM and MM testing
Notermans, G., De Jong, P., Kuper, F.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
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Conference Proceeding
Investigations on the thermal behavior of interconnects under ESD transients using a simplified thermal RC network
Salome, P., Leroux, C., Crevel, P., Chante, J.P.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
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Conference Proceeding
Semiconductor process and structural optimization of shallow trench isolation-defined and polysilicon-bound source/drain diodes for ESD networks
Voldman, S., Geissler, S., Nakos, J., Pekarik, J., Gauthier, R.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
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Conference Proceeding
An experimental and theoretical consideration of physical design parameters in field-induced charged device model ESD simulators and their impact upon measured withstand voltages
Carey, R.E., DeChiaro, L.F.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
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Conference Proceeding
A simulation study of HBM failure in an internal clock buffer and the design issues for efficient power pin protection strategy
Puvvada, V., Duvvury, C.
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Published in Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) (1998)
Get full text
Conference Proceeding