Using silicon-germanium mainstream BiCMOS technology for X-band and LMDS (25-30 GHz) microwave applications
Subbanna, S., Groves, R., Jagannathan, B., Greenberg, D., Freeman, G., Volant, R., Ahlgren, D., Martin, B., Stein, K., Herman, D., Meyerson, B.
Published in 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) (2002)
Published in 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) (2002)
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Journal Article
ESD robustness of a BiCMOS SiGe technology
Voldman, S., Juliano, P., Schmidt, N., Botula, A., Johnson, R., Lanzerotti, L., Feilchenfeld, N., Joseph, J., Malinowski, J., Eld, E., Gross, V., Brennan, C., Dunn, J., Harame, D., Herman, D., Meyerson, B.
Published in Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124) (2000)
Published in Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124) (2000)
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Conference Proceeding
High reliability metal insulator metal capacitors for silicon germanium analog applications
Stein, K., Kocis, J., Hueckel, G., Eld, E., Bartush, T., Groves, R., Greco, N., Harame, D., Tewksbury, T.
Published in Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting (1997)
Published in Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting (1997)
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Conference Proceeding
SiGe HBT technology: device and application issues
Harame, D., Larson, L., Case, M., Kovacic, S., Voinigescu, S., Tewksbury, T., Nguyen-Ngoc, D., Stein, K., Cressler, J., Jeng, S.-J., Malinowski, J., Groves, R., Eld, E., Sunderland, D., Rensch, D., Gilbert, M., Schonenberg, K., Ahlgren, D., Rosenbaum, S., Glenn, J., Meyerson, B.
Published in Proceedings of International Electron Devices Meeting (1995)
Published in Proceedings of International Electron Devices Meeting (1995)
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Gate-assisted lateral PNP active load for analog SiGe HBT technology
Sunderland, D.A., Schonenberg, K.T., Stein, K.J., Meyerson, B.S., Harame, D.L., Jeng, S.-J., Nguyen-Ngoc, D., Martin, B., Eld, E.C., Tewksbury, T., Ahlgren, D.C., Gilbert, M.M., Malinowski, J.C.
Published in Proceedings of the 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting (1996)
Published in Proceedings of the 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting (1996)
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A high-performance sub-0.25 /spl mu/m CMOS technology with multiple thresholds and copper interconnects
Su, L., Schulz, R., Adkisson, J., Beyer, K., Biery, G., Cote, W., Crabbe, E., Edelstein, D., Ellis-Monaghan, J., Eld, E., Foster, D., Gehres, R., Goldblatt, R., Greco, N., Guenther, C., Heidenreich, J., Herman, J., Kiesling, D., Lin, L., Lo, S.-H., McKenna, J., Megivern, C., Ng, H., Oberschmidt, J., Ray, A., Rohrer, N., Tallman, K., Wagner, T., Davari, B.
Published in 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216) (1998)
Published in 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216) (1998)
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A high-density 6.9 sq. /spl mu/m embedded SRAM cell in a high-performance 0.25 /spl mu/m-generation CMOS logic technology
Subbanna, S., Agnello, P., Crabbe, E., Schulz, R., Wu, S., Tallman, K., Saccamango, M.J., Greco, S., McGahay, V., Allen, A.J., Chen, B., Cotler, T., Eld, E., Lasky, J., Ng, H., Ray, A., Snare, J., Su, L., Sunderland, D., Sun, J., Davari, B.
Published in International Electron Devices Meeting. Technical Digest (1996)
Published in International Electron Devices Meeting. Technical Digest (1996)
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