Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates
Upadhyay, M., Ben Elbahri, M., Mezhoud, M., Coq Germanicus, R., Lüders, U.
Published in Solid-state electronics (01.12.2021)
Published in Solid-state electronics (01.12.2021)
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Journal Article
Study on the dielectric properties of Al 2 O 3 /TiO 2 sub-nanometric laminates: effect of the bottom electrode and the total thickness
Ben Elbahri, M, Kahouli, A, Mercey, B, Lebedev, O, Donner, W, Lüders, U
Published in Journal of physics. D, Applied physics (14.02.2018)
Published in Journal of physics. D, Applied physics (14.02.2018)
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Journal Article
High Dielectric Constant Sub - Nanometric Laminates of Binary Oxides for the Application in High-Density Capacitances
Upadhyay, M., Elbahri, M. Ben, Germanicus, R. Coq, Luders, U.
Published in 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.09.2020)
Published in 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.09.2020)
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Conference Proceeding