Impact of CnRx Structure on Soft Error Rates of Flip-Flop Designs at 22-nm FD SOI Node
Elash, Christopher J., Li, Zongru, Jin, Chen, Chen, Li, Wen, Shi-Jie, Fung, Rita, Xing, Jiesi, Shi, Shuting, Yang, Zhi Wu, Bhuva, Bharat L.
Published in IEEE transactions on nuclear science (01.08.2023)
Published in IEEE transactions on nuclear science (01.08.2023)
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Journal Article
Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node
Elash, Christopher J., Li, Zongru, Jin, Chen, Chen, Li, Xing, Jiesi, Yang, Zhiwu, Shi, Shuting
Published in Applied sciences (22.04.2022)
Published in Applied sciences (22.04.2022)
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Journal Article
Comparison of Total Ionizing Dose Effects in 22-nm and 28-nm FD SOI Technologies
Li, Zongru, Elash, Christopher Jarrett, Jin, Chen, Chen, Li, Xing, Jiesi, Yang, Zhiwu, Shi, Shuting
Published in Electronics (Basel) (01.06.2022)
Published in Electronics (Basel) (01.06.2022)
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Journal Article
SEU Performance of RHBD Flip-Flops Using Guard-Gates at 22-nm FDSOI Technology Node
Li, Zongru, Elash, Christopher, Xing, Jiesi, Jin, Chen, Chen, Li, Wen, Shi-Jie, Fung, Rita, Shi, Shuting, Yang, Zhi Wu, Bhuva, Bharat L.
Published in IEEE transactions on nuclear science (01.08.2023)
Published in IEEE transactions on nuclear science (01.08.2023)
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Journal Article
SEU performance of Schmitt-trigger-based flip-flops at the 22-nm FD SOI technology node
Li, Zongru, Elash, Christopher, Jin, Chen, Chen, Li, Wen, Shi-Jie, Fung, Rita, Xing, Jiesi, Shi, Shuting, Yang, Zhi Wu, Bhuva, Bharat L.
Published in Microelectronics and reliability (01.07.2023)
Published in Microelectronics and reliability (01.07.2023)
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Journal Article
Efficacy of Transistor Stacking on Flip-Flop SEU Performance at 22-nm FDSOI Node
Li, Zongru, Elash, Christopher, Jin, Chen, Chen, Li, Wen, Shi-Jie, Fung, Rita, Xing, Jiesi, Shi, Shuting, Yang, Zhi Wu, Bhuva, Bharat L.
Published in IEEE transactions on nuclear science (01.04.2023)
Published in IEEE transactions on nuclear science (01.04.2023)
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Journal Article
Development and Delivery of an Electric Circuits Course Featuring Competency Based Assessment for First Year Engineering
Frey, Joel, Adams, Elizabeth, Huang, Shaobo, Elash, Christopher
Published in Proceedings of the Canadian Engineering Education Association (CEEA) (01.11.2022)
Published in Proceedings of the Canadian Engineering Education Association (CEEA) (01.11.2022)
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Journal Article