Towards quantitative scanning electron microscopy: Applications to nano-scale analysis
El-Gomati, M.M., Walker, C.G.H., Zha, X.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.07.2011)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.07.2011)
Get full text
Journal Article
Why is it that differently doped regions in semiconductors are visible in low voltage SEM?
El-Gomati, M.M., Wells, T.C.R., Mullerova, I., Frank, L., Jayakody, H.
Published in IEEE transactions on electron devices (01.02.2004)
Published in IEEE transactions on electron devices (01.02.2004)
Get full text
Journal Article
Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer
Bodik, M, Demydenko, M., Walker, C. G. H., Bahler, T., Michlmayr, T., Thamm, A.-K., Ramsperger, U., Pratt, A., Tear, S.P., El Gomati, M.M., Pescia, D.
Published in 2021 34th International Vacuum Nanoelectronics Conference (IVNC) (05.07.2021)
Published in 2021 34th International Vacuum Nanoelectronics Conference (IVNC) (05.07.2021)
Get full text
Conference Proceeding
Imaging of doped Si in low and very low voltage SEM: the contrast interpretation
Jayakody, G.H., Wells, T.R.C., El-Gomati, M.M.
Published in Journal of electron spectroscopy and related phenomena (01.05.2005)
Published in Journal of electron spectroscopy and related phenomena (01.05.2005)
Get full text
Journal Article
Acquisition of the dopant contrast in semiconductors with slow electrons
Frank, L., Hovorka, M., El-Gomati, M.M., Müllerová, I., Mika, F., Mikmeková, E.
Published in Journal of electron spectroscopy and related phenomena (01.05.2020)
Published in Journal of electron spectroscopy and related phenomena (01.05.2020)
Get full text
Journal Article
Controlling the growth of carbon nanotubes for electronic devices
Mann, M., Zhang, Y., Teo, K.B.K., Wells, T., El Gomati, M.M., Milne, W.I.
Published in Microelectronic engineering (01.05.2010)
Published in Microelectronic engineering (01.05.2010)
Get full text
Journal Article
Conference Proceeding
Electron energy analysis at the nanometer scale using a near field emission scanning electron microscope (NFESEM)
Suri, Ashish, Pratt, A., Tear, S.P., Walker, C.G.H., Bahler, T., El Gomati, M.M.
Published in 2018 31st International Vacuum Nanoelectronics Conference (IVNC) (01.07.2018)
Published in 2018 31st International Vacuum Nanoelectronics Conference (IVNC) (01.07.2018)
Get full text
Conference Proceeding
Field emission studies of tungsten-coated silicon-based field emitters
Get full text
Journal Article
Conference Proceeding
Enhanced angular current intensity from Schottky emitters
FUJITA, S, WELLS, T.R.C, USHIO, W, SATO, H, EL-GOMATI, M.M
Published in Journal of microscopy (Oxford) (01.09.2010)
Published in Journal of microscopy (Oxford) (01.09.2010)
Get full text
Journal Article
Internal scattering in a single pass cylindrical mirror analyses
El Bakush, T.A., El Gomati, M.M.
Published in Journal of electron spectroscopy and related phenomena (31.10.1995)
Published in Journal of electron spectroscopy and related phenomena (31.10.1995)
Get full text
Journal Article
Fabrication of tungsten coated silicon based gated emitters
Chen, L., El-Gomati, M.M.
Published in Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382) (1998)
Published in Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382) (1998)
Get full text
Conference Proceeding
Dual mode micromachined electron energy analyser
Johnson, S., El Gomati, M.M.
Published in Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382) (1998)
Published in Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382) (1998)
Get full text
Conference Proceeding