Low Frequency Noise Study of X-ray Irradiated Si/SiGe:C BiCMOS Technology Bipolar Transistors
Belie, A. Adebabay, El Beyrouthy, J., Pascal, F., Boch, J., Maraine, T., Hoffmann, A., Bouhouche, M., Sagnes, B., Haendler, S., Chevalier, P., Gloria, D.
Published in 2023 International Conference on Noise and Fluctuations (ICNF) (17.10.2023)
Published in 2023 International Conference on Noise and Fluctuations (ICNF) (17.10.2023)
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Conference Proceeding
Impact of Gamma irradiation on advanced Si/SiGe:C BiCMOS technology: comparison versus X-ray
El Beyrouthy, J., Sagnes, B., Pascal, F., Elsherif, M., Boch, J., Maraine, T., Haendler, S., Chevalier, P., Gloria, D.
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
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Conference Proceeding
Effects of Total Ionizing Dose on 1-V and Low Frequency Noise characteristics in advanced Si/SiGe:C Heterojunction Bipolar Transistors
El Beyrouthy, J., Vauthelin, A., Seif, M., Sagnes, B., Pascal, F., Hoffman, A., Valenza, M., Boch, J., Maraine, T., Haendler, S., Gauthier, A., Chevalier, P., Gloria, D.
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding