New approach to estimate nanowear test results through nanoindentation test
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Conference Proceeding
Deposition of silicon oxide film from tetraethoxysilane using a pulsed dielectric barrier discharge
Ulejczyk, B., Karpiński, L., Scholz, M., Ekwińska, M. A., Rymuza, Z., Opalińska, T., Żukowska, E. A., Schmidt-Szałowski, K.
Published in Czechoslovak journal of physics (01.01.2006)
Published in Czechoslovak journal of physics (01.01.2006)
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Journal Article