by Whyte, J. R., McQuaid, R. G. P., Ashcroft, C. M., Einsle, J. F., Canalias, C., Gruverman, A., Gregg, J. M.
Published in Journal of applied physics (14.08.2014)

by Einsle, J. F., Martineau, Ben, Buisman, Iris, Vukmanovic, Zoja, Johnstone, Duncan, Eggeman, Alex, Midgley, Paul A., Harrison, Richard J.
Published in Microscopy and microanalysis (01.08.2018)

by Loughran, T. H. J., Roth, J., Keatley, P. S., Hendry, E., Barnes, W. L., Hicken, R. J., Einsle, J. F., Amy, A., Hendren, W., Bowman, R. M., Dawson, P.
Published in AIP advances (01.05.2018)

by Duran, E.C., Kho, Z., Einsle, J.F., Azaceta, I., Cavill, S.A., Kerrigan, A., Lazarov, V.K., Eggeman, A.S.
Published in Computational materials science (01.09.2023)

by Einsle, Joshua F, Scheunert, Gunther, Murphy, Antony, McPhillips, John, Zayats, Anatoly V, Pollard, Robert, Bowman, Robert M
Published in Nanotechnology (21.12.2012)

by Gatel, C., Masseboeuf, A., Snoeck, E., Bonnilla, F., Blon, T., Lacroix, L.-M., Meffre, A., Einsle, J.F., Bowman, R.M., Bashir, M.A., Gubbins, M.
Published in Microscopy and microanalysis (01.08.2015)