by van Zeijl, P, Eikenbroek, J-WT, Vervoort, P-P, Setty, S, Tangenherg, J, Shipton, G, Kooistra, E, Keekstra, I C, Belot, D, Visser, K, Bosma, E, Blaakmeer, S C
Published in IEEE journal of solid-state circuits (01.12.2002)