ESD Immunity Prediction of D Flip-Flop in the ISO 10605 Standard Using a Behavioral Modeling Methodology
Guangyao Shen, Sen Yang, Khilkevich, Victor V., Pommerenke, David J., Aichele, Hermann L., Eichel, Dirk R., Keller, Christoph
Published in IEEE transactions on electromagnetic compatibility (01.08.2015)
Published in IEEE transactions on electromagnetic compatibility (01.08.2015)
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