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"Eckersall, K."
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"Eckersall, K."
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Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons
by
Yu, S.
,
Jervis, B.W.
,
Eckersall, K.R.
,
Bell, I.M.
Published in
IEEE transactions on computer-aided design of integrated circuits and systems
(01.08.1997)
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Concurrent self test of switched current circuits based on the S/sup 2/I-technique
by
Saether, G.E.
,
Toumazou, C.
,
Taylor, G.
,
Eckersall
,
K
.
,
Bell, I.M.
Published in
1995 IEEE International Symposium on Circuits and Systems (ISCAS)
(1995)
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Monitoring Technological Change
by
Brinkworth, B. J
,
Eckersall
,
K
. E
Year of Publication
1985
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Fault orientated test and fault simulation of mixed signal integrated circuits
by
Bell, I.M.
,
Eckersall, K.R.
,
Spinks, S.J.
,
Taylor, G.E.
Published in
1995 IEEE International Symposium on Circuits and Systems (ISCAS)
(1995)
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