by Kaplar, R. J., Gunning, B. P., Allerman, A. A., Crawford, M. H., Flicker, J. D., Armstrong, A. M., Yates, L., Binder, A. T., Dickerson, J. R., Pickrell, G., Sharps, P., Anderson, T., Gallagher, J., Jacobs, A., Koehler, A., Tadjer, M., Hobart, K., Ebrish, M., Porter, M., Martinez, R., Zeng, K., Ji, D., Chowdhury, S., Aktas, O., Cooper, J.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)

by Ebrish, M. A., Koester, S. J.
Published in 70th Device Research Conference (01.06.2012)