Vertical-Gate Si/SiGe Double-HBT-Based Capacitorless 1T DRAM Cell for Extended Retention Time at Low Latch Voltage
Shin, Ja Sun, Choi, Hyunjun, Bae, Hagyoul, Jang, Jaeman, Yun, Daeyoun, Hong, Euiyoun, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.02.2012)
Published in IEEE electron device letters (01.02.2012)
Get full text
Journal Article
A Novel Double HBT-Based Capacitorless 1T DRAM Cell With Si/SiGe Heterojunctions
JA SUN SHIN, BAE, Hagyoul, JANG, Jaeman, YUN, Daeyoun, LEE, Jieun, HONG, Euiyoun, DAE HWAN KIM, DONG MYONG KIM
Published in IEEE electron device letters (01.07.2011)
Published in IEEE electron device letters (01.07.2011)
Get full text
Journal Article
Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I–V and low frequency C–V measurement
Shin, Ja Sun, Bae, Hagyoul, Hong, Euiyoun, Jang, Jaeman, Yun, Daeyoun, Lee, Jieun, Kim, Dae Hwan, Kim, Dong Myong
Published in Solid-state electronics (01.06.2012)
Published in Solid-state electronics (01.06.2012)
Get full text
Journal Article
Hybrid C- V and I - V Technique for Separate Extraction of Structure- and Bias-Dependent Parasitic Resistances in a-InGaZnO TFTs
BAE, Hagyoul, HUR, Inseok, DAE HWAN KIM, DONG MYONG KIM, JA SUN SHIN, YUN, Daeyoun, HONG, Euiyoun, JUNG, Keum-Dong, PARK, Mun-Soo, CHOI, Sunwoong, WON HEE LEE, UHM, Mihee
Published in IEEE electron device letters (01.04.2012)
Published in IEEE electron device letters (01.04.2012)
Get full text
Journal Article
Subbandgap Optical Differential Body-Factor Technique and Characterization of Interface States in SOI MOSFETs
EUIYOUN HONG, YUN, Daeyoun, DONG MYONG KIM, BAE, Hagyoul, HYUNJUN CHOI, WON HEE LEE, UHM, Mihee, SEO, Hyojoon, LEE, Jieun, JAEMAN JANG, DAE HWAN KIM
Published in IEEE electron device letters (01.07.2012)
Published in IEEE electron device letters (01.07.2012)
Get full text
Journal Article
Vertical-Gate Si/SiGe Double-HBT-Based Capacitorless IT DRAM Cell for Extended Retention Time at Low Latch Voltage
JA SUN SHIN, CHOI, Hyunjun, BAE, Hagyoul, JANG, Jaeman, YUN, Daeyoun, HONG, Euiyoun, DAE HWAN KIM, DONG MYONG KIM
Published in IEEE electron device letters (2012)
Get full text
Published in IEEE electron device letters (2012)
Journal Article
Hybrid [Formula Omitted]- [Formula Omitted] and [Formula Omitted] -[Formula Omitted] Technique for Separate Extraction of Structure- and Bias-Dependent Parasitic Resistances in a-InGaZnO TFTs
Bae, Hagyoul, Hur, Inseok, Shin, Ja Sun, Yun, Daeyoun, Hong, Euiyoun, Jung, Keum-Dong, Park, Mun-Soo, Choi, Sunwoong, Lee, Won Hee, Uhm, Mihee, Kim, Dae Hwan, Kim, Dong Myong
Published in IEEE electron device letters (01.04.2012)
Published in IEEE electron device letters (01.04.2012)
Get full text
Journal Article