An Iterative Surface Potential Algorithm Including Interface Traps for Compact Modeling of SiC-MOSFETs
Albrecht, M., Klupfel, F. J., Erlbacher, T.
Published in IEEE transactions on electron devices (01.03.2020)
Published in IEEE transactions on electron devices (01.03.2020)
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Journal Article
Methodology for the investigation of threading dislocations as a source of vertical leakage in AlGaN/GaN-HEMT heterostructures for power devices
Besendörfer, S., Meissner, E., Lesnik, A., Friedrich, J., Dadgar, A., Erlbacher, T.
Published in Journal of applied physics (07.03.2019)
Published in Journal of applied physics (07.03.2019)
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Journal Article
RESURF n-LDMOS Transistor for Advanced Integrated Circuits in 4H-SiC
WeiBe, J., Matthus, C., Schlichting, H., Mitlehner, H., Erlbacher, T.
Published in IEEE transactions on electron devices (01.08.2020)
Published in IEEE transactions on electron devices (01.08.2020)
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Journal Article
Optimized Design for 4H-SiC Power DMOSFET
Di Benedetto, L., Licciardo, G. D., Erlbacher, T., Bauer, A. J., Rubino, A.
Published in IEEE electron device letters (01.11.2016)
Published in IEEE electron device letters (01.11.2016)
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Journal Article
Aluminum acceptor activation and charge compensation in implanted p-type 4H-SiC
Weiße, J., Hauck, M., Krieger, M., Bauer, A. J., Erlbacher, T.
Published in AIP advances (01.05.2019)
Published in AIP advances (01.05.2019)
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Journal Article
Interplay between C-doping, threading dislocations, breakdown, and leakage in GaN on Si HEMT structures
Besendörfer, S., Meissner, E., Zweipfennig, T., Yacoub, H., Fahle, D., Behmenburg, H., Kalisch, H., Vescan, A., Friedrich, J., Erlbacher, T.
Published in AIP advances (01.04.2020)
Published in AIP advances (01.04.2020)
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Journal Article
Post-trench processing of silicon deep trench capacitors for power electronic applications
Banzhaf, S., Schwaiger, S., Erlbacher, T., Bauer, A. J., Frey, L.
Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
Published in 2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (01.06.2016)
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Conference Proceeding
Journal Article
Silicon integrated RC snubbers for applications up to 900V with reduced mechanical stress and high manufacturability
Krach, F., Thielen, N., Heckel, T., Bauer, A. J., Erlbacher, T., Frey, L.
Published in 2016 74th Annual Device Research Conference (DRC) (01.06.2016)
Published in 2016 74th Annual Device Research Conference (DRC) (01.06.2016)
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Conference Proceeding
ATHENIS_3D: Automotive tested high-voltage and embedded non-volatile integrated SoC platform with 3D technology
Wachmann, E, Saponara, S, Zambelli, C, Tisserand, P, Charbonnier, J, Erlbacher, T, Gruenler, S, Hartler, C, Siegert, J, Chassard, P, Ton, D M, Ferrari, L, Fanucci, L
Published in Proceedings - Design, Automation, and Test in Europe Conference and Exhibition (01.03.2016)
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Published in Proceedings - Design, Automation, and Test in Europe Conference and Exhibition (01.03.2016)
Journal Article
Comparative study between conventional macroscopic IV techniques and advanced AFM based methods for electrical characterization of dielectrics at the nanoscale
Yanev, V., Erlbacher, T., Rommel, M., Bauer, A.J., Frey, L.
Published in Microelectronic engineering (01.07.2009)
Published in Microelectronic engineering (01.07.2009)
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Journal Article
Conference Proceeding
4H-SiC PIN Photodiode for VUV Detection Using an Enhanced Emitter Doping Design
Schraml, M., Papathanasiou, N., May, A., Rommel, M., Erlbacher, T.
Published in 2023 IEEE Photonics Conference (IPC) (12.11.2023)
Published in 2023 IEEE Photonics Conference (IPC) (12.11.2023)
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Conference Proceeding
HfSiO/SiO2-and SiO2/HfSiO/SiO2-gate stacks for non-volatile memories
ERLBACHER, T, JANK, M. P. M, LEMBERGER, M, BAUER, A. J, RYSSEL, H
Published in Thin solid films (01.09.2008)
Published in Thin solid films (01.09.2008)
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Journal Article
Hafnium silicate as control oxide in non-volatile memories
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Journal Article
Conference Proceeding
Via Size-Dependent Properties of TiAl Ohmic Contacts on 4H-SiC
May, Alexander, Erlbacher, Tobias, Beuer, Susanne, Rommel, Mathias
Published in Materials science forum (31.05.2022)
Published in Materials science forum (31.05.2022)
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Journal Article
Defect reduction in SiC epilayers by different substrate cleaning methods
Baierhofer, D., Thomas, B., Staiger, F., Marchetti, B., Förster, C., Erlbacher, T.
Published in Materials science in semiconductor processing (15.03.2022)
Published in Materials science in semiconductor processing (15.03.2022)
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Journal Article