Method of improving image sharpness for annular-illumination scanning electron microscopes
Enyama, Momoyo, Hamada, Koichi, Fukuda, Muneyuki, Kazumi, Hideyuki
Published in Japanese Journal of Applied Physics (01.06.2016)
Published in Japanese Journal of Applied Physics (01.06.2016)
Get full text
Journal Article
Fast Evaluation of Microstructure-Property Relation in Duplex Alloys Using SEM Images
Krasienapibal, Thantip S., Shirasaki, Yasuhiro, Enyama, Momoyo, Kagatsume, Akiko, Park, Minseok, Tanimoto, Sayaka
Published in MRS advances (01.01.2019)
Published in MRS advances (01.01.2019)
Get full text
Journal Article
High-Reflectance-Resolution Optical Reflectometry with Synthesis of Optical Coherence Function
He, Zuyuan, Yoshiyama, Soshi, Enyama, Momoyo, Hotate, Kazuo
Published in Japanese Journal of Applied Physics (01.01.2005)
Published in Japanese Journal of Applied Physics (01.01.2005)
Get full text
Journal Article
하전 입자선 장치
IKEGAMI AKIRA, ENYAMA MOMOYO, KAWANO HAJIME, SAKAKIBARA MAKOTO, SHIRASAKI YASUHIRO
Year of Publication 27.01.2022
Get full text
Year of Publication 27.01.2022
Patent
CHARGED PARTICLE BEAM DEVICE
SHIRASAKI Yasuhiro, SAKAKIBARA Makoto, ENYAMA Momoyo, IKEGAMI Akira, KAWANO Hajime
Year of Publication 25.03.2021
Get full text
Year of Publication 25.03.2021
Patent
ELECTRON BEAM OBSERVATION DEVICE ELECTRON BEAM OBSERVATION SYSTEM AND METHOD FOR CONTROLLING ELECTRON BEAM OBSERVATION DEVICE
YUMIBA RYOU, HAMADA KOICHI, ENYAMA MOMOYO, YAMAGUCHI SATORU, KIMURA MEGUMI, SAKAKIBARA MAKOTO, SAKAI KEI, SETOGUCHI KATSUMI
Year of Publication 28.01.2022
Get full text
Year of Publication 28.01.2022
Patent
CHARGED-PARTICLE BEAM APPLICATION DEVICE
DOBASHI, Takashi, KAWAMOTO, Yuta, SHIRASAKI, Yasuhiro, ENYAMA, Momoyo, IKEGAMI, Akira
Year of Publication 03.10.2019
Get full text
Year of Publication 03.10.2019
Patent
ELECTRON GUN AND ELECTRON-BEAM APPLICATION DEVICE
KATANE Junichi, OSE Yoichi, AGEMURA Toshihide, OHSHIMA Takashi, KOHMU Naohiro, ENYAMA Momoyo, IDE Tatsuro, MORISHITA Hideo
Year of Publication 06.05.2021
Get full text
Year of Publication 06.05.2021
Patent
CHARGED PARTICLE BEAM DEVICE
SUZUKI Makoto, SAKAKIBARA Makoto, ENYAMA Momoyo, TANIMOTO Kenji, SASAKI Yuko, KAWANO Hajime
Year of Publication 07.01.2021
Get full text
Year of Publication 07.01.2021
Patent
ANALYZING SYSTEM
SHIRASAKI Yasuhiro, PARK Minseok, ENYAMA Momoyo, HATANO Michio, KAGATSUME Akiko
Year of Publication 01.11.2018
Get full text
Year of Publication 01.11.2018
Patent
전자빔 관찰 장치, 전자빔 관찰 시스템, 전자빔 관찰 장치에 있어서의 화상 보정 방법 및 화상 보정을 위한 보정 계수 산출 방법
TAKASUGI YASUNORI, YUMIBA RYOU, HAMADA KOICHI, ENYAMA MOMOYO, YAMAGUCHI SATORU, KIMURA MEGUMI, SAKAKIBARA MAKOTO, SHIRAI MASUMI, SAKAI KEI, SETOGUCHI KATSUMI
Year of Publication 26.05.2021
Get full text
Year of Publication 26.05.2021
Patent