Highly Reliable 4H-SiC Epitaxial Wafer with BPD Free Recombination-Enhancing Buffer Layer for High Current Applications
Enokizono, Taro, Furumai, Masaki, Itoh, Hironori, Miyase, Takaya, Hori, Tsutomu, Wada, Keiji, Doi, Hideyuki
Published in Materials science forum (28.07.2020)
Published in Materials science forum (28.07.2020)
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Journal Article